Abstract
The use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticalscarbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.
| Original language | English |
|---|---|
| Pages (from-to) | 1366-1368 |
| Number of pages | 3 |
| Journal | CrystEngComm |
| Volume | 12 |
| Issue number | 5 |
| Early online date | 19 Oct 2009 |
| DOIs | |
| Publication status | Published - 2010 |
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Keywords
- nanocrystalline molecular materials
- crystals
- x-rays
- scattering
Cite this
Billinge, S. J. L., Dykhne, T., Juhas, P., Bozin, E., Taylor, R., Florence, A., & Shankland, K. (2010). Characterisation of amorphous and nanocrystalline molecular materials by total scattering. CrystEngComm, 12(5), 1366-1368. https://doi.org/10.1039/b915453a