Characterisation of a laser plasma accelerator x-ray source size using a Kirkpatrick-Baez microscope

Mohammed Shahzad, Lewis R. Reid, Roman Spesyvtsev, Antoine Maitrallain, George K. Holt, Wentao Li, Gregory Vieux, Enrico Brunetti, S. Mark Wiggins, Giancarlo Gatti, D De Luis, Luca Volpe, Robert Fedosejevs, Dino A. Jaroszynski

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Abstract

Laser plasma accelerators are highly versatile and are sources of both radiation and particle beams, with unique properties. The Scottish Centre for Application based Plasma Accelerators (SCAPA) 40 TW and 350 TW laser at the University of Strathclyde has been used to produce both soft and hard x-rays using a laser wakefield accelerator (LWFA). The inherent characteristics of these femtosecond duration pulsed x-rays make them ideal for probing matter and ultrafast imaging applications. To support the development of applications of laser plasma accelerators at the SCAPA facility an adjustable Kirkpatrick-Baez x-ray microscope has been designed to focus 50 eV - 10 KeV x-rays. It is now possible to produce high quality at silicon wafers substrates that can be used for x-ray optics. Platinum-coated (40 nm) silicon wafers have been used in the KB instrument to image the LWFA x-ray source. We simulate the source distribution as part of an investigation to determine the x-ray source size and therefore its transverse coherence and ultimately the peak brilliance. The OASYS SHAODOW-OUI raytracing and wave propagation code has been used to simulate the imaging setup and determine instrument resolution.

Original languageEnglish
Title of host publicationSPIE Optics + Optoelectronics
EditorsMinSup Hur, Dino A. Jaroszynski
Place of PublicationBellingham, W.A.
Number of pages7
Volume11036
ISBN (Electronic)9781510627383
DOIs
Publication statusPublished - 4 Apr 2019

Keywords

  • laser plasma accelerator
  • Kirkpatrick-Baez microscope

Projects

Datasets

KB characterisation using OASYS

Shahzad, M. (Creator), University of Strathclyde, 26 Aug 2019

Dataset

Cite this

Shahzad, M., Reid, L. R., Spesyvtsev, R., Maitrallain, A., Holt, G. K., Li, W., Vieux, G., Brunetti, E., Wiggins, S. M., Gatti, G., Luis, D. D., Volpe, L., Fedosejevs, R., & Jaroszynski, D. A. (2019). Characterisation of a laser plasma accelerator x-ray source size using a Kirkpatrick-Baez microscope. In M. Hur, & D. A. Jaroszynski (Eds.), SPIE Optics + Optoelectronics (Vol. 11036). [110360Q]. https://doi.org/10.1117/12.2522778