Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

Research output: Contribution to journalConference Contribution

LanguageEnglish
Pages906-907
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue numberS3
Early online date27 Aug 2014
DOIs
Publication statusPublished - Aug 2014
EventMicroscopy & Microanalysis 2014 - Connecticut, Hartford, United States
Duration: 3 Aug 20147 Aug 2014

Cite this

@article{e935e98cb6424f28ab8ea53125de8911,
title = "Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables",
author = "Edwards, {Paul R.} and Wallace, {Michael J.} and Gunnar Kusch and Gunasekar Naresh-Kumar and Jochen Bruckbauer and Carol Trager-Cowan and O'Donnell, {Kevin P.} and Martin, {Robert W.}",
year = "2014",
month = "8",
doi = "10.1017/S1431927614006254",
language = "English",
volume = "20",
pages = "906--907",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
number = "S3",

}

TY - JOUR

T1 - Cathodoluminescence hyperspectral imaging of nitride semiconductors

T2 - Microscopy and Microanalysis

AU - Edwards, Paul R.

AU - Wallace, Michael J.

AU - Kusch, Gunnar

AU - Naresh-Kumar, Gunasekar

AU - Bruckbauer, Jochen

AU - Trager-Cowan, Carol

AU - O'Donnell, Kevin P.

AU - Martin, Robert W.

PY - 2014/8

Y1 - 2014/8

UR - http://journals.cambridge.org/action/displayJournal?jid=MAM

U2 - 10.1017/S1431927614006254

DO - 10.1017/S1431927614006254

M3 - Conference Contribution

VL - 20

SP - 906

EP - 907

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S3

ER -