Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

Paul R. Edwards; Michael J. Wallace; Gunnar Kusch; Gunasekar Naresh-Kumar; Jochen Bruckbauer; Carol Trager-Cowan; Kevin P. O'Donnell; Robert W. Martin

doi:10.1017/S1431927614006254

Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

Paul R. Edwards, Michael J. Wallace, Gunnar Kusch, Gunasekar Naresh-Kumar, Jochen Bruckbauer, Carol Trager-Cowan, Kevin P. O'Donnell, Robert W. Martin

Research output: Contribution to journal › Conference Contribution › peer-review

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Original language	English
Pages (from-to)	906-907
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	S3
Early online date	27 Aug 2014
DOIs	https://doi.org/10.1017/S1431927614006254
Publication status	Published - Aug 2014
Event	Microscopy & Microanalysis 2014 - Connecticut, Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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10.1017/S1431927614006254

Edwards-etal-MM2014-cathodoluminescence-hyperspectral-imaging-of-nitride-semiconductorsFinal published version, 1.23 MB

Cite this

@article{e935e98cb6424f28ab8ea53125de8911,

title = "Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables",

author = "Edwards, {Paul R.} and Wallace, {Michael J.} and Gunnar Kusch and Gunasekar Naresh-Kumar and Jochen Bruckbauer and Carol Trager-Cowan and O'Donnell, {Kevin P.} and Martin, {Robert W.}",

year = "2014",

month = aug,

doi = "10.1017/S1431927614006254",

language = "English",

volume = "20",

pages = "906--907",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S3",

note = "Microscopy & Microanalysis 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Cathodoluminescence hyperspectral imaging of nitride semiconductors

T2 - Microscopy & Microanalysis 2014

AU - Edwards, Paul R.

AU - Wallace, Michael J.

AU - Kusch, Gunnar

AU - Naresh-Kumar, Gunasekar

AU - Bruckbauer, Jochen

AU - Trager-Cowan, Carol

AU - O'Donnell, Kevin P.

AU - Martin, Robert W.

PY - 2014/8

Y1 - 2014/8

UR - http://journals.cambridge.org/action/displayJournal?jid=MAM

U2 - 10.1017/S1431927614006254

DO - 10.1017/S1431927614006254

M3 - Conference Contribution

VL - 20

SP - 906

EP - 907

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S3

Y2 - 3 August 2014 through 7 August 2014

ER -

Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

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Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Gallium nitride enabled hybrid and flexible photonics

Microscopy & Microanalysis 2014

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Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

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Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Gallium nitride enabled hybrid and flexible photonics

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Microscopy & Microanalysis 2014

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