Bit pattern dependent effect reduction in all-optical 3R regeneration

Research output: Contribution to conference › Paper

Abstract

This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

Original language	English
Pages	39-142
Number of pages	103
Publication status	Published - Sept 2001
Event	3rd Electronic Circuits and Systems Conference - Bratislava, Slovakia Duration: 5 Sept 2001 → 7 Sept 2001

Conference	3rd Electronic Circuits and Systems Conference
Country/Territory	Slovakia
City	Bratislava
Period	5/09/01 → 7/09/01

@conference{f3a230a5e2fd43c391683e3e7e55f452,

title = "Bit pattern dependent effect reduction in all-optical 3R regeneration",

abstract = "This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration",

keywords = "bit pattern, dependent effect, reduction, all-optical, 3r regeneration",

author = "I. Glesk and B.C Wang and L. Xu and Dujin Zhou and Runser, \{Robert J.\} and P.R. Prucnal",

year = "2001",

month = sep,

language = "English",

pages = "39--142",

note = "3rd Electronic Circuits and Systems Conference ; Conference date: 05-09-2001 Through 07-09-2001",

}

TY - CONF

T1 - Bit pattern dependent effect reduction in all-optical 3R regeneration

AU - Glesk, I.

AU - Wang, B.C

AU - Xu, L.

AU - Zhou, Dujin

AU - Runser, Robert J.

AU - Prucnal, P.R.

PY - 2001/9

Y1 - 2001/9

N2 - This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

AB - This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

KW - bit pattern

KW - dependent effect

KW - reduction

KW - all-optical

KW - 3r regeneration

M3 - Paper

SP - 39

EP - 142

T2 - 3rd Electronic Circuits and Systems Conference

Y2 - 5 September 2001 through 7 September 2001

ER -