Bit pattern dependent effect reduction in all-optical 3R regeneration

I. Glesk, B.C Wang, L. Xu, Dujin Zhou, Robert J. Runser, P.R. Prucnal

Research output: Contribution to conferencePaper

Abstract

This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration
Original languageEnglish
Pages39-142
Number of pages103
Publication statusPublished - Sep 2001
Event3rd Electronic Circuits and Systems Conference - Bratislava, Slovakia
Duration: 5 Sep 20017 Sep 2001

Conference

Conference3rd Electronic Circuits and Systems Conference
CountrySlovakia
CityBratislava
Period5/09/017/09/01

Keywords

  • bit pattern
  • dependent effect
  • reduction
  • all-optical
  • 3r regeneration

Cite this

Glesk, I., Wang, B. C., Xu, L., Zhou, D., Runser, R. J., & Prucnal, P. R. (2001). Bit pattern dependent effect reduction in all-optical 3R regeneration. 39-142. Paper presented at 3rd Electronic Circuits and Systems Conference, Bratislava, Slovakia.
Glesk, I. ; Wang, B.C ; Xu, L. ; Zhou, Dujin ; Runser, Robert J. ; Prucnal, P.R. / Bit pattern dependent effect reduction in all-optical 3R regeneration. Paper presented at 3rd Electronic Circuits and Systems Conference, Bratislava, Slovakia.103 p.
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keywords = "bit pattern, dependent effect, reduction, all-optical, 3r regeneration",
author = "I. Glesk and B.C Wang and L. Xu and Dujin Zhou and Runser, {Robert J.} and P.R. Prucnal",
year = "2001",
month = "9",
language = "English",
pages = "39--142",
note = "3rd Electronic Circuits and Systems Conference ; Conference date: 05-09-2001 Through 07-09-2001",

}

Glesk, I, Wang, BC, Xu, L, Zhou, D, Runser, RJ & Prucnal, PR 2001, 'Bit pattern dependent effect reduction in all-optical 3R regeneration' Paper presented at 3rd Electronic Circuits and Systems Conference, Bratislava, Slovakia, 5/09/01 - 7/09/01, pp. 39-142.

Bit pattern dependent effect reduction in all-optical 3R regeneration. / Glesk, I.; Wang, B.C; Xu, L.; Zhou, Dujin; Runser, Robert J.; Prucnal, P.R.

2001. 39-142 Paper presented at 3rd Electronic Circuits and Systems Conference, Bratislava, Slovakia.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Bit pattern dependent effect reduction in all-optical 3R regeneration

AU - Glesk, I.

AU - Wang, B.C

AU - Xu, L.

AU - Zhou, Dujin

AU - Runser, Robert J.

AU - Prucnal, P.R.

PY - 2001/9

Y1 - 2001/9

N2 - This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

AB - This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

KW - bit pattern

KW - dependent effect

KW - reduction

KW - all-optical

KW - 3r regeneration

M3 - Paper

SP - 39

EP - 142

ER -

Glesk I, Wang BC, Xu L, Zhou D, Runser RJ, Prucnal PR. Bit pattern dependent effect reduction in all-optical 3R regeneration. 2001. Paper presented at 3rd Electronic Circuits and Systems Conference, Bratislava, Slovakia.