Bit pattern dependent effect reduction in all-optical 3R regeneration

I. Glesk, B.C Wang, L. Xu, Dujin Zhou, Robert J. Runser, P.R. Prucnal

Research output: Contribution to conferencePaper

Abstract

This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration
Original languageEnglish
Pages39-142
Number of pages103
Publication statusPublished - Sep 2001
Event3rd Electronic Circuits and Systems Conference - Bratislava, Slovakia
Duration: 5 Sep 20017 Sep 2001

Conference

Conference3rd Electronic Circuits and Systems Conference
CountrySlovakia
CityBratislava
Period5/09/017/09/01

Keywords

  • bit pattern
  • dependent effect
  • reduction
  • all-optical
  • 3r regeneration

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