Atomic resolution imaging of dislocations in algan and the efficiency of UV LEDs

Colin J. Humphreys, Fabien C-P. Massabuau, Sneha L. Rhode, Matthew K. Horton, Thomas J. O'Hanlon, Andras Kovacs, Marcin S. Zielinski, Menno J. Kappers, Rafal E. Dunin-Borkowski, Rachel A. Oliver

Research output: Contribution to journalMeeting abstractpeer-review

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Abstract

[Abstract not available]
Original languageEnglish
Pages (from-to)4-5
Number of pages2
JournalMicroscopy and Microanalysis
Volume24
Issue numberS1
DOIs
Publication statusPublished - 1 Aug 2018
EventMicroscopy and Microanalysis 2018 - Baltimore, United States
Duration: 5 Aug 20189 Aug 2018
https://www.microscopy.org/MandM/2018/

Keywords

  • atomic resolution imaging
  • dislocations
  • AIGaN
  • efficiency
  • UV LEDs

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