Abstract
Language | Undefined/Unknown |
---|---|
Title of host publication | Testing: Academic and Industrial Conference - Proceedings of Practice and Research Techniques, 2009 (TAIC PART '09) |
Publisher | IEEE |
Pages | 125-126 |
Number of pages | 2 |
DOIs | |
Publication status | Published - 2009 |
Keywords
- artifical immune systems
- danger theory
- oracle problem
Cite this
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Artifical immune systems, danger theory, and the oracle problem. / Roper, M.
Testing: Academic and Industrial Conference - Proceedings of Practice and Research Techniques, 2009 (TAIC PART '09) . IEEE, 2009. p. 125-126.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book
TY - GEN
T1 - Artifical immune systems, danger theory, and the oracle problem
AU - Roper, M.
PY - 2009
Y1 - 2009
N2 - The oracle problem - the mechanism by which the output associated with a test is determined to pass or fail - is an important, but frequently neglected, challenge for software testing researchers. Artificial immune systems offer a potentially interesting avenue of attack but using their power as classifiers to distinguish between pass outputs and fail outputs. Danger theory looks for other signals to improve this classification. The aim of this paper is to consider how AIS and danger theory may be applied to the oracle problem.
AB - The oracle problem - the mechanism by which the output associated with a test is determined to pass or fail - is an important, but frequently neglected, challenge for software testing researchers. Artificial immune systems offer a potentially interesting avenue of attack but using their power as classifiers to distinguish between pass outputs and fail outputs. Danger theory looks for other signals to improve this classification. The aim of this paper is to consider how AIS and danger theory may be applied to the oracle problem.
KW - artifical immune systems
KW - danger theory
KW - oracle problem
UR - http://www2009.taicpart.org/
U2 - 10.1109/TAICPART.2009.36
DO - 10.1109/TAICPART.2009.36
M3 - Conference contribution book
SP - 125
EP - 126
BT - Testing: Academic and Industrial Conference - Proceedings of Practice and Research Techniques, 2009 (TAIC PART '09)
PB - IEEE
ER -