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Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
Carol Trager-Cowan, Naresh Gunasekar, Benjamin Hourahine, Paul Edwards, Jochen Bruckbauer, Robert Martin, Christof Mauder, Austin Day, Gordon England, Aimo Winkelmann, Peter Parbrook, Anjus Wilkinson
Research output: Contribution to journal › Conference article › peer-review
1
Citation
(Scopus)