Application of Time of Flight - Secondary Ion Mass Spectrometry (ToF-SIMS) in the analysis of pharmaceutical solid forms

Eleonora Paladino, Ivan Hall Barrientos, Elanor Brammer, Dimitrios A. Lamprou, Gavin Halbert

Research output: Contribution to conferenceSpeech

Original languageEnglish
Publication statusUnpublished - Sep 2016
Event7th APS International PharmSci Conference - University of Strathclyde, Glasgow, United Kingdom
Duration: 5 Sep 20167 Sep 2016
https://www.ukpharmsci.org/

Conference

Conference7th APS International PharmSci Conference
CountryUnited Kingdom
CityGlasgow
Period5/09/167/09/16
Internet address

Keywords

  • ToF-SIMS imaging
  • pharmaceutical samples
  • mass spectrometry

Cite this

Paladino, E., Hall Barrientos, I., Brammer, E., Lamprou, D. A., & Halbert, G. (2016). Application of Time of Flight - Secondary Ion Mass Spectrometry (ToF-SIMS) in the analysis of pharmaceutical solid forms. 7th APS International PharmSci Conference, Glasgow, United Kingdom.