Analysis of doping concentration and composition in wide bandgap AlGaN:Si by wavelength dispersive X-ray spectroscopy

Gunnar Kusch, Frank Mehnke, Johannes Enslin, Paul R Edwards, Tim Wernicke, Michael Kneissl, Robert W Martin

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)
121 Downloads (Pure)

Search results