Advanced simulation of ITER core X-ray crystal spectroscopy

Xinyi Jin; Zhifeng Cheng; Junli Zhang; Wei Yan; Zhongyong Chen; Novimir Pablant; Lan Gao; Dian Lu; Martin O’Mullane; Raphael Tieulent; Robin Barnsley

doi:10.1063/5.0253335

Advanced simulation of ITER core X-ray crystal spectroscopy

Xinyi Jin, Zhifeng Cheng, Junli Zhang, Wei Yan, Zhongyong Chen, Novimir Pablant, Lan Gao, Dian Lu, Martin O’Mullane, Raphael Tieulent, Robin Barnsley

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

X-Ray Simulation Analysis (XRSA) is an analytical ray-tracing mixed code developed specifically for the ITER Core X-Ray Crystal Spectroscopy (XRCS-Core) diagnostic, which employs a dual-reflection configuration incorporating multiple pre-reflectors made of Highly Oriented Pyrolytic Graphite (HOPG) and spherically curved analyzing crystals. The ITER XRCS-Core is designed for high spectral resolution measurement in specific wavelength ranges, including narrow bands around 1.354 Å for W64+, 2.19 Å for Xe51+, and 2.555 Å for Xe44+ and Xe47+, enabling diagnostic capability across a broad electron temperature range in the ITER plasma. XRSA facilitates efficient simulation of the spectral performance of this complex X-ray spectroscopic system. Recent updates to the XRSA code have incorporated two critical effects: auto-focusing, which specifically applies to HOPG, and polarization. These two effects are particularly important in the dual-reflection configuration used in the ITER XRCS-Core system to provide more accurate modeling results. Simulations conducted with the updated code demonstrate that polarization has a substantial impact on the performance of the dual-reflection system. Additionally, the combined influence of polarization and system layout introduces performance variations across channels through the same crystal.

Original language	English
Article number	053503
Journal	Review of Scientific Instruments
Volume	96
Issue number	5
DOIs	https://doi.org/10.1063/5.0253335
Publication status	Published - 8 May 2025

Funding

This work was partially supported by the National Natural Science Foundation of China (Nos. 12475222, 12205122, and 51821005) and Hubei International Science and Technology Cooperation Projects (No. 2022EHB003).

Keywords

computer graphics
crystal spectroscopy
crystal orientation
optical properties
X-ray spectroscopy
crystal optics
polarization
plasma diagnostics

Access to Document

10.1063/5.0253335

Jin-etal-2025-Advanced-simulation-of-ITER-core-X-ray-crystal-spectroscopy
For the purpose of Open Access, a CC BY 4.0 licence has been applied to this document
Accepted author manuscript, 533 KBLicence: CC BY 4.0

Cite this

@article{82440b079c474580b711694d1f363d8e,

title = "Advanced simulation of ITER core X-ray crystal spectroscopy",

abstract = "X-Ray Simulation Analysis (XRSA) is an analytical ray-tracing mixed code developed specifically for the ITER Core X-Ray Crystal Spectroscopy (XRCS-Core) diagnostic, which employs a dual-reflection configuration incorporating multiple pre-reflectors made of Highly Oriented Pyrolytic Graphite (HOPG) and spherically curved analyzing crystals. The ITER XRCS-Core is designed for high spectral resolution measurement in specific wavelength ranges, including narrow bands around 1.354 {\AA} for W64+, 2.19 {\AA} for Xe51+, and 2.555 {\AA} for Xe44+ and Xe47+, enabling diagnostic capability across a broad electron temperature range in the ITER plasma. XRSA facilitates efficient simulation of the spectral performance of this complex X-ray spectroscopic system. Recent updates to the XRSA code have incorporated two critical effects: auto-focusing, which specifically applies to HOPG, and polarization. These two effects are particularly important in the dual-reflection configuration used in the ITER XRCS-Core system to provide more accurate modeling results. Simulations conducted with the updated code demonstrate that polarization has a substantial impact on the performance of the dual-reflection system. Additionally, the combined influence of polarization and system layout introduces performance variations across channels through the same crystal.",

keywords = "computer graphics, crystal spectroscopy, crystal orientation, optical properties, X-ray spectroscopy, crystal optics, polarization, plasma diagnostics",

author = "Xinyi Jin and Zhifeng Cheng and Junli Zhang and Wei Yan and Zhongyong Chen and Novimir Pablant and Lan Gao and Dian Lu and Martin O{\textquoteright}Mullane and Raphael Tieulent and Robin Barnsley",

year = "2025",

month = may,

day = "8",

doi = "10.1063/5.0253335",

language = "English",

volume = "96",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "5",

}

TY - JOUR

T1 - Advanced simulation of ITER core X-ray crystal spectroscopy

AU - Jin, Xinyi

AU - Cheng, Zhifeng

AU - Zhang, Junli

AU - Yan, Wei

AU - Chen, Zhongyong

AU - Pablant, Novimir

AU - Gao, Lan

AU - Lu, Dian

AU - O’Mullane, Martin

AU - Tieulent, Raphael

AU - Barnsley, Robin

PY - 2025/5/8

Y1 - 2025/5/8

N2 - X-Ray Simulation Analysis (XRSA) is an analytical ray-tracing mixed code developed specifically for the ITER Core X-Ray Crystal Spectroscopy (XRCS-Core) diagnostic, which employs a dual-reflection configuration incorporating multiple pre-reflectors made of Highly Oriented Pyrolytic Graphite (HOPG) and spherically curved analyzing crystals. The ITER XRCS-Core is designed for high spectral resolution measurement in specific wavelength ranges, including narrow bands around 1.354 Å for W64+, 2.19 Å for Xe51+, and 2.555 Å for Xe44+ and Xe47+, enabling diagnostic capability across a broad electron temperature range in the ITER plasma. XRSA facilitates efficient simulation of the spectral performance of this complex X-ray spectroscopic system. Recent updates to the XRSA code have incorporated two critical effects: auto-focusing, which specifically applies to HOPG, and polarization. These two effects are particularly important in the dual-reflection configuration used in the ITER XRCS-Core system to provide more accurate modeling results. Simulations conducted with the updated code demonstrate that polarization has a substantial impact on the performance of the dual-reflection system. Additionally, the combined influence of polarization and system layout introduces performance variations across channels through the same crystal.

AB - X-Ray Simulation Analysis (XRSA) is an analytical ray-tracing mixed code developed specifically for the ITER Core X-Ray Crystal Spectroscopy (XRCS-Core) diagnostic, which employs a dual-reflection configuration incorporating multiple pre-reflectors made of Highly Oriented Pyrolytic Graphite (HOPG) and spherically curved analyzing crystals. The ITER XRCS-Core is designed for high spectral resolution measurement in specific wavelength ranges, including narrow bands around 1.354 Å for W64+, 2.19 Å for Xe51+, and 2.555 Å for Xe44+ and Xe47+, enabling diagnostic capability across a broad electron temperature range in the ITER plasma. XRSA facilitates efficient simulation of the spectral performance of this complex X-ray spectroscopic system. Recent updates to the XRSA code have incorporated two critical effects: auto-focusing, which specifically applies to HOPG, and polarization. These two effects are particularly important in the dual-reflection configuration used in the ITER XRCS-Core system to provide more accurate modeling results. Simulations conducted with the updated code demonstrate that polarization has a substantial impact on the performance of the dual-reflection system. Additionally, the combined influence of polarization and system layout introduces performance variations across channels through the same crystal.

KW - computer graphics

KW - crystal spectroscopy

KW - crystal orientation

KW - optical properties

KW - X-ray spectroscopy

KW - crystal optics

KW - polarization

KW - plasma diagnostics

U2 - 10.1063/5.0253335

DO - 10.1063/5.0253335

M3 - Article

SN - 0034-6748

VL - 96

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 5

M1 - 053503

ER -

Advanced simulation of ITER core X-ray crystal spectroscopy

Abstract

Funding

Keywords

Access to Document

Fingerprint

Cite this