A PYNQ evaluation platform for FPGA architectures of the Line Hough Transform

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Abstract

The Line Hough Transform (LHT) is an effective line detection algorithm for digital images. To meet real-time requirements, Field Programmable Gate Arrays (FPGAs) are often chosen to accelerate the LHT. However, many LHT architectures select different design parameters and discretisation steps for the Hough Parameter Space (HPS). The work presented in this paper describes a novel evaluation platform for FPGA architectures of the LHT. Our system is named the Hough Evaluation Platform (HEP) and can be used to visualise and inspect the HPS produced from LHT architectures that use different design parameters. Architectures are compared by evaluating the HPS using a unique measurement named the Peak to Mean Vote Ratio (PMVR). Our system employs the PYNQ framework on a Xilinx Zynq MPSoC device for the visualisation of the HPS and also determines the processing time of a given LHT architecture. The HEP has been implemented on a XCZU7EV-2e device and can operate up to a target frequency of 250 MHz.
Original languageEnglish
Title of host publication2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)
Place of PublicationPiscataway, NJ.
PublisherIEEE
Pages133-137
Number of pages5
ISBN (Print)9781728180595
DOIs
Publication statusPublished - 2 Sep 2020
EventIEEE International Midwest Symposium on Circuits and Systems 2020 - Sheraton Hotel, Springfield, United States
Duration: 9 Aug 202012 Aug 2020
http://mwscas2020.org/

Conference

ConferenceIEEE International Midwest Symposium on Circuits and Systems 2020
Abbreviated titleMWSCAS 2020
CountryUnited States
CitySpringfield
Period9/08/2012/08/20
Internet address

Keywords

  • Hough
  • lines
  • PYNQ
  • FPGA
  • evaluation
  • platform
  • HDL coder
  • mathworks
  • vivado

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    Northcote, D., Crockett, L. H., Murray, P., & Stewart, R. W. (2020). A PYNQ evaluation platform for FPGA architectures of the Line Hough Transform. In 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS) (pp. 133-137). [9184499] IEEE. https://doi.org/10.1109/MWSCAS48704.2020.9184499