We report on a practical method for the implementation of Adaptive Optics in optical sectioning microscopy to remove system and sample induced aberrations. Correcting for induced aberrations on a pixel-by-pixel basis would take in excess of 4 minutes and greatly increase the risk of sample damage due to photo-bleaching and photo-toxicity; this is clearly an impractical approach. We show that a single aberration correction per optical slice is adequate to significantly improve the image quality across the whole field of view. We present results illustrating the success of this method for a sample scanning and beam scanning system using confocal and multiphoton microscopy.
|Title of host publication||Adaptive Optics For Industry And Medicine: Proceedings of the Sixth International Workshop|
|Place of Publication||London, United Kingdom|
|Number of pages||5|
|Publication status||Published - 2007|
- adaptive optics
- optical sectioning microscopy
- beam scanning system