Abstract
We report on a practical method for the implementation of Adaptive Optics in optical sectioning microscopy to remove system and sample induced aberrations. Correcting for induced aberrations on a pixel-by-pixel basis would take in excess of 4 minutes and greatly increase the risk of sample damage due to photo-bleaching and photo-toxicity; this is clearly an impractical approach. We show that a single aberration correction per optical slice is adequate to significantly improve the image quality across the whole field of view. We present results illustrating the success of this method for a sample scanning and beam scanning system using confocal and multiphoton microscopy.
Original language | English |
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Title of host publication | Adaptive Optics For Industry And Medicine: Proceedings of the Sixth International Workshop |
Place of Publication | London, United Kingdom |
Pages | 382-387 |
Number of pages | 5 |
DOIs | |
Publication status | Published - 2007 |
Keywords
- adaptive optics
- optical sectioning microscopy
- aberrations
- photo-bleaching
- photo-toxicity
- beam scanning system
- confocal
- multiphoton