A fast multilayer window design tool, simulations and comparison with experiment

C.G. Whyte; A.R. Young; D.H. Rowlands; C.W. Robertson; A.D.R. Phelps; W.L. He; A.W. Cross; K. Ronald

doi:10.1109/IVELEC.2008.4556362

A fast multilayer window design tool, simulations and comparison with experiment

C.G. Whyte, A.R. Young, D.H. Rowlands, C.W. Robertson, A.D.R. Phelps, W.L. He, A.W. Cross, K. Ronald

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

1 Citation (Scopus)

Abstract

This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.

Original language	English
Title of host publication	Proceedings of the IEEE International Vacuum Electronics Conference, 2008
Subtitle of host publication	IVEC 2008
Publisher	IEEE
Pages	318-319
Number of pages	2
ISBN (Print)	978-1-4244-1715-5
DOIs	https://doi.org/10.1109/IVELEC.2008.4556362
Publication status	Published - Apr 2008
Event	IEEE International Vacuum Electronics Conference, 2008. IVEC 2008 - Monterey, California, United States Duration: 22 Apr 2008 → 24 Apr 2008

Conference

Conference	IEEE International Vacuum Electronics Conference, 2008. IVEC 2008
Country/Territory	United States
City	Monterey, California
Period	22/04/08 → 24/04/08

Keywords

UHV window design
multilayer window structures

Access to Document

10.1109/IVELEC.2008.4556362

Cite this

@inproceedings{f3d99726d80d400ab4beb48faed4722d,

title = "A fast multilayer window design tool, simulations and comparison with experiment",

abstract = "This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.",

keywords = "UHV window design, multilayer window structures",

author = "C.G. Whyte and A.R. Young and D.H. Rowlands and C.W. Robertson and A.D.R. Phelps and W.L. He and A.W. Cross and K. Ronald",

year = "2008",

month = apr,

doi = "10.1109/IVELEC.2008.4556362",

language = "English",

isbn = "978-1-4244-1715-5",

pages = "318--319",

booktitle = "Proceedings of the IEEE International Vacuum Electronics Conference, 2008",

publisher = "IEEE",

note = "IEEE International Vacuum Electronics Conference, 2008. IVEC 2008 ; Conference date: 22-04-2008 Through 24-04-2008",

}

Whyte, CG , Young, AR, Rowlands, DH, Robertson, CW , Phelps, ADR, He, WL, Cross, AW & Ronald, K 2008, A fast multilayer window design tool, simulations and comparison with experiment. in Proceedings of the IEEE International Vacuum Electronics Conference, 2008: IVEC 2008. IEEE, pp. 318-319, IEEE International Vacuum Electronics Conference, 2008. IVEC 2008, Monterey, California, United States, 22/04/08. https://doi.org/10.1109/IVELEC.2008.4556362

TY - GEN

T1 - A fast multilayer window design tool, simulations and comparison with experiment

AU - Whyte, C.G.

AU - Young, A.R.

AU - Rowlands, D.H.

AU - Robertson, C.W.

AU - Phelps, A.D.R.

AU - He, W.L.

AU - Cross, A.W.

AU - Ronald, K.

PY - 2008/4

Y1 - 2008/4

N2 - This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.

AB - This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.

KW - UHV window design

KW - multilayer window structures

UR - http://dx.doi.org/10.1109/IVELEC.2008.4556362

U2 - 10.1109/IVELEC.2008.4556362

DO - 10.1109/IVELEC.2008.4556362

M3 - Conference contribution book

SN - 978-1-4244-1715-5

SP - 318

EP - 319

BT - Proceedings of the IEEE International Vacuum Electronics Conference, 2008

PB - IEEE

T2 - IEEE International Vacuum Electronics Conference, 2008. IVEC 2008

Y2 - 22 April 2008 through 24 April 2008

ER -

A fast multilayer window design tool, simulations and comparison with experiment

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Compression of frequency modulated pulses using a high order helically corrugated waveguide

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A fast multilayer window design tool, simulations and comparison with experiment

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Keywords

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Compression of frequency modulated pulses using a high order helically corrugated waveguide

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