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This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.
|Title of host publication||Proceedings of the IEEE International Vacuum Electronics Conference, 2008|
|Subtitle of host publication||IVEC 2008|
|Number of pages||2|
|Publication status||Published - Apr 2008|
|Event||IEEE International Vacuum Electronics Conference, 2008. IVEC 2008 - Monterey, California, United States|
Duration: 22 Apr 2008 → 24 Apr 2008
|Conference||IEEE International Vacuum Electronics Conference, 2008. IVEC 2008|
|Period||22/04/08 → 24/04/08|
- UHV window design
- multilayer window structures
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