A fast multilayer window design tool, simulations and comparison with experiment

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

1 Citation (Scopus)

Abstract

This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.
LanguageEnglish
Title of host publicationProceedings of the IEEE International Vacuum Electronics Conference, 2008
Subtitle of host publicationIVEC 2008
PublisherIEEE
Pages318-319
Number of pages2
ISBN (Print)978-1-4244-1715-5
DOIs
Publication statusPublished - Apr 2008
EventIEEE International Vacuum Electronics Conference, 2008. IVEC 2008 - Monterey, California, United States
Duration: 22 Apr 200824 Apr 2008

Conference

ConferenceIEEE International Vacuum Electronics Conference, 2008. IVEC 2008
CountryUnited States
CityMonterey, California
Period22/04/0824/04/08

Fingerprint

simulation
S matrix theory
reflectance
microwaves
operators
optimization
wavelengths

Keywords

  • UHV window design
  • multilayer window structures

Cite this

Whyte, C. G., Young, A. R., Rowlands, D. H., Robertson, C. W., Phelps, A. D. R., He, W. L., ... Ronald, K. (2008). A fast multilayer window design tool, simulations and comparison with experiment. In Proceedings of the IEEE International Vacuum Electronics Conference, 2008: IVEC 2008 (pp. 318-319). IEEE. https://doi.org/10.1109/IVELEC.2008.4556362
Whyte, C.G. ; Young, A.R. ; Rowlands, D.H. ; Robertson, C.W. ; Phelps, A.D.R. ; He, W.L. ; Cross, A.W. ; Ronald, K. / A fast multilayer window design tool, simulations and comparison with experiment. Proceedings of the IEEE International Vacuum Electronics Conference, 2008: IVEC 2008. IEEE, 2008. pp. 318-319
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abstract = "This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.",
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Whyte, CG, Young, AR, Rowlands, DH, Robertson, CW, Phelps, ADR, He, WL, Cross, AW & Ronald, K 2008, A fast multilayer window design tool, simulations and comparison with experiment. in Proceedings of the IEEE International Vacuum Electronics Conference, 2008: IVEC 2008. IEEE, pp. 318-319, IEEE International Vacuum Electronics Conference, 2008. IVEC 2008, Monterey, California, United States, 22/04/08. https://doi.org/10.1109/IVELEC.2008.4556362

A fast multilayer window design tool, simulations and comparison with experiment. / Whyte, C.G.; Young, A.R.; Rowlands, D.H.; Robertson, C.W.; Phelps, A.D.R.; He, W.L.; Cross, A.W.; Ronald, K.

Proceedings of the IEEE International Vacuum Electronics Conference, 2008: IVEC 2008. IEEE, 2008. p. 318-319.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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AB - This paper presents the results from a new approach to UHV window design at Strathclyde University. The modelling of multilayer window structures using conventional commercial codes is time consuming and prone to numerical instabilities as the layer thicknesses are significantly less than a wavelength. We have used a scattering matrix approach to analyse the frequency dependence of the window reflection co-efficient combined with an automatic optimisation routine which determines the optimum layer thickness for maximum window return loss within the parameter space allowed by the operator. Results from these simulations are compared to both conventional commercial codes (Microwave Studio) and laboratory experiments.

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Whyte CG, Young AR, Rowlands DH, Robertson CW, Phelps ADR, He WL et al. A fast multilayer window design tool, simulations and comparison with experiment. In Proceedings of the IEEE International Vacuum Electronics Conference, 2008: IVEC 2008. IEEE. 2008. p. 318-319 https://doi.org/10.1109/IVELEC.2008.4556362