A digital system and method for testing analogue and mixed-signal circuits or systems

D.J. Hamilton (Inventor), B.P. Stimpson (Inventor), M. Bekheit (Inventor)

Research output: Patent

Abstract

A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.
Original languageEnglish
Patent numberWO 2003/107019 A2
IPC7G 01R 31/00 A
Publication statusPublished - 24 Dec 2003

Keywords

  • analogue circuits
  • mixed-signal circuits
  • faulty circuits

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  • Cite this

    Hamilton, D. J., Stimpson, B. P., & Bekheit, M. (2003). IPC No. 7G 01R 31/00 A. A digital system and method for testing analogue and mixed-signal circuits or systems. (Patent No. WO 2003/107019 A2).