A digital system and method for testing analogue and mixed-signal circuits or systems

D.J. Hamilton; B.P. Stimpson; M. Bekheit

A digital system and method for testing analogue and mixed-signal circuits or systems

D.J. Hamilton (Inventor), B.P. Stimpson (Inventor), M. Bekheit (Inventor)

Electronic And Electrical Engineering

Research output: Patent

Abstract

A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.

Original language	English
Patent number	WO 2003/107019 A2
IPC	7G 01R 31/00 A
Publication status	Published - 24 Dec 2003

Keywords

analogue circuits
mixed-signal circuits
faulty circuits

Cite this

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AU - Stimpson, B.P.

AU - Bekheit, M.

PY - 2003/12/24

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N2 - A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.

AB - A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.

KW - analogue circuits

KW - mixed-signal circuits

KW - faulty circuits

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M3 - Patent

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A digital system and method for testing analogue and mixed-signal circuits or systems

Abstract

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