A detailed study of multiply charged ion production within a high intensity laser focus

A. A. A. El-Zein, P. McKenna, W. A. Bryan, I. M. G. Johnston, T. R. J. Goodworth, J. H. Sanderson, I. D. Williams, W. R. Newell, P. F. Taday, E. J. Divall, A. J. Langley

Research output: Contribution to journalConference article

15 Citations (Scopus)

Abstract

We have observed the variation in ion signal as a function of intensity within a focused laser spot. Using an aperture detector, the ion signals from narrow bands of the laser focus have been observed. By moving the laser focus along the direction of propagation, regions of different intensities are exposed to the detector. This has allowed detailed measurements to be made of ion signals as a function of laser intensity.

LanguageEnglish
Pages119-121
Number of pages3
JournalPhysica Scripta
Volume92
Issue numberT92
DOIs
Publication statusPublished - 31 Dec 2001
Event10th International Conference on the Physics of Highly Charged Ions - Berkeley, CA, United States
Duration: 30 Jul 20002 Aug 2000

Fingerprint

high power lasers
Multiplication
Laser
lasers
ions
Detector
detectors
narrowband
apertures
Propagation
propagation

Keywords

  • aperture detector
  • ion signals
  • laser focus

Cite this

El-Zein, A. A. A., McKenna, P., Bryan, W. A., Johnston, I. M. G., Goodworth, T. R. J., Sanderson, J. H., ... Langley, A. J. (2001). A detailed study of multiply charged ion production within a high intensity laser focus. Physica Scripta, 92(T92), 119-121. https://doi.org/10.1238/Physica.Topical.092a00119
El-Zein, A. A. A. ; McKenna, P. ; Bryan, W. A. ; Johnston, I. M. G. ; Goodworth, T. R. J. ; Sanderson, J. H. ; Williams, I. D. ; Newell, W. R. ; Taday, P. F. ; Divall, E. J. ; Langley, A. J. / A detailed study of multiply charged ion production within a high intensity laser focus. In: Physica Scripta. 2001 ; Vol. 92, No. T92. pp. 119-121.
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El-Zein, AAA, McKenna, P, Bryan, WA, Johnston, IMG, Goodworth, TRJ, Sanderson, JH, Williams, ID, Newell, WR, Taday, PF, Divall, EJ & Langley, AJ 2001, 'A detailed study of multiply charged ion production within a high intensity laser focus' Physica Scripta, vol. 92, no. T92, pp. 119-121. https://doi.org/10.1238/Physica.Topical.092a00119

A detailed study of multiply charged ion production within a high intensity laser focus. / El-Zein, A. A. A.; McKenna, P.; Bryan, W. A.; Johnston, I. M. G.; Goodworth, T. R. J.; Sanderson, J. H.; Williams, I. D.; Newell, W. R.; Taday, P. F.; Divall, E. J.; Langley, A. J.

In: Physica Scripta, Vol. 92, No. T92, 31.12.2001, p. 119-121.

Research output: Contribution to journalConference article

TY - JOUR

T1 - A detailed study of multiply charged ion production within a high intensity laser focus

AU - El-Zein, A. A. A.

AU - McKenna, P.

AU - Bryan, W. A.

AU - Johnston, I. M. G.

AU - Goodworth, T. R. J.

AU - Sanderson, J. H.

AU - Williams, I. D.

AU - Newell, W. R.

AU - Taday, P. F.

AU - Divall, E. J.

AU - Langley, A. J.

PY - 2001/12/31

Y1 - 2001/12/31

N2 - We have observed the variation in ion signal as a function of intensity within a focused laser spot. Using an aperture detector, the ion signals from narrow bands of the laser focus have been observed. By moving the laser focus along the direction of propagation, regions of different intensities are exposed to the detector. This has allowed detailed measurements to be made of ion signals as a function of laser intensity.

AB - We have observed the variation in ion signal as a function of intensity within a focused laser spot. Using an aperture detector, the ion signals from narrow bands of the laser focus have been observed. By moving the laser focus along the direction of propagation, regions of different intensities are exposed to the detector. This has allowed detailed measurements to be made of ion signals as a function of laser intensity.

KW - aperture detector

KW - ion signals

KW - laser focus

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U2 - 10.1238/Physica.Topical.092a00119

DO - 10.1238/Physica.Topical.092a00119

M3 - Conference article

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SP - 119

EP - 121

JO - Physica Scripta

T2 - Physica Scripta

JF - Physica Scripta

SN - 0031-8949

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ER -