A 192 X 128 time correlated SPAD image sensor in 40nm CMOS technology

Robert K. Henderson, Nick Johnston, Francesco Mattioli Della Rocca, Haochang Chen, David Day-Uei Li, Graham Hungerford, Richard Hirsch, David McLoskey, Philip Yip, David J.S. Birch

Research output: Contribution to journal › Article › peer-review

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