A 192 x 128 time correlated single photon counting imager in 40nm CMOS technology

Robert K. Henderson, Nick Johnston, Haochang Chen, David Day-Uei Li, Graham Hungerford, Richard Hirsch, Philip Yip, David McLoskey, David Birch

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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A 192 x 128 pixel single photon avalanche diode (SPAD) time-resolved single photon counting (TCPSC) image sensor is implemented in STMicroelectronics 40nm CMOS technology. The 13 % fill-factor, 18.4 x 9.2 mm pixel contains a 33 ps resolution, 135 ns full-scale, 12-bit time to digital converter (TDC) with 0.9 LSB differential and 8.7 LSB integral nonlinearity (DNL/INL). The sensor achieves a mean 219 ps fullwidth half maximum (FWHM) impulse response function (IRF) and a 5 mW core power consumption and is operable at up to 18.6 kfps. Cylindrical microlenses with a concentration factor of 3.15 increase the fill-factor to 41%. The median dark count rate (DCR) is 25 Hz at 1.5 V excess bias. Fluorescence lifetime imaging (FLIM) results are presented.
Original languageEnglish
Title of host publication44th European Solid-State Circuits Conference (ESSCIRC) 2018
Place of PublicationPiscataway, NJ
Number of pages4
Publication statusPublished - 4 Sept 2018
Event44th European Solid-State Circuits Conference - Dresden, Germany
Duration: 3 Sept 20186 Sept 2018


Conference44th European Solid-State Circuits Conference


  • single photon avalanche diode
  • photon counting


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