Abstract
The development and production of metals and alloys with grain sizes of tenths and hundredths of a micrometer (submicro- and nanocrystals) with desired physicochemical properties is an important problem of modern materials science [1]. Recently, a number of attempts have been made to use cryogenic deformation to grind grain size [2–4], and most of this work was performed on highly plastic copper. It seems relevant to a detailed study of the microstructure after cryogenic deformation, as well as the mechanisms of its formation. This work was aimed at a thorough certification of the microstructure of copper subjected to varying degrees of low-temperature deformation. For the certification of the microstructure, a relatively new method of automatic analysis of backscattered electron diffraction patterns (EBSD) was used.
Translated title of the contribution | Low-temperature deformation of copper |
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Original language | Russian |
Pages | 301-304 |
Number of pages | 4 |
Publication status | Published - 13 Apr 2010 |
Event | X Peterburgskie chteniya - St. Petersburg, Russian Federation Duration: 13 Apr 2010 → 15 Apr 2010 |
Conference
Conference | X Peterburgskie chteniya |
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Country/Territory | Russian Federation |
City | St. Petersburg |
Period | 13/04/10 → 15/04/10 |
Keywords
- cryogenic deformation
- copper
- nanocrystal architectures