Quantitative non-destructive nanoscale characterisation of advanced materials

Research output

Research output per year 2017 2020 2025

• 22 Article
• 2 Conference article

Research output per year

Research output per year

Search results

• 2025

  Strain and luminescence properties of hexagonal hillocks in N-polar GaN

  Bruckbauer, J., Cios, G., Sarua, A., Feng, P., Wang, T., Hourahine, B., Winkelmann, A., Trager-Cowan, C. & Martin, R., 7 Apr 2025, In: Journal of Applied Physics. 137, 13, 135705.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Cathodoluminescence 100%
  • Luminescence 100%
  • Electron Backscatter Diffraction 100%
  • Density 50%
  • Scanning Electron Microscopy 50%

• Role of the electron transport layer in dictating the nanoscale heterogeneity in all-inorganic perovskite absorbers – correlating the optoelectronic and crystallographic properties

  Nicholson, S., Bruckbauer, J., Edwards, P. R., Trager-Cowan, C., Martin, R. W. & Ivaturi, A., 1 Apr 2025, In: Journal of Materials Chemistry A. 13, 15, p. 11003-11014 12 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Crystallographic Property 100%
  • Electron Transfer 100%
  • Titanium Dioxide 50%
  • Zinc Oxide 50%
  • Tin Oxide 50%

• Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction

  Waters, D. M., Thompson, B., Ferenczi, G., Hourahine, B., Cios, G., Winkelmann, A., Stark, C. J. M., Wetzel, C., Trager-Cowan, C. & Bruckbauer, J., 27 Jan 2025, In: Journal of Applied Physics. 137, 4, 13 p., 045701.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Si Substrate 100%
  • Flat Surface 100%
  • Misalignment 100%
  • Zincblende 100%
  • Electron Backscatter Diffraction 100%
  3 Downloads (Pure)
• 2024

  Unravelling the chloride dopant induced film improvement in all-inorganic perovskite absorbers

  Nicholson, S., Bruckbauer, J., Edwards, P. R., Trager-Cowan, C., Martin, R. W. & Ivaturi, A., 7 Oct 2024, In: Journal of Materials Chemistry A. 12, 37, p. 25131-25139 9 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Doping (Additives) 100%
  • Film 100%
  • Metal 25%
  • Materials 25%
  • Crystal Structure 12%
  3 Citations (Scopus)

  8 Downloads (Pure)
• 2023

  Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction

  Hiller, K. P., Winkelmann, A., Hourahine, B., Starosta, B., Alasmari, A., Feng, P., Wang, T., Parbrook, P. J., Zubialevich, V. Z., Hagedorn, S., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Bruckbauer, J. & Trager-Cowan, C., 31 Dec 2023, In: Microscopy and Microanalysis. 29, 6, p. 1879-1888 10 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Dislocation 100%
  • Nitride Compound 100%
  • Electron Backscatter Diffraction 100%
  • Thin Films 100%
  • Diffraction 100%
  2 Citations (Scopus)

  57 Downloads (Pure)
• 2022

  Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics

  Ghosh, P., Bruckbauer, J., Trager-Cowan, C. & Jagadamma, L. K., 1 Aug 2022, In: Applied Surface Science. 592, 28 p., 152865.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Photovoltaics 100%
  • Devices 100%
  • Crystalline Material 100%
  • Perovskites 100%
  • Stability 50%
  16 Citations (Scopus)

  42 Downloads (Pure)

• Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy

  Naresh-Kumar, G., Edwards, P. R., Batten, T., Nouf-Allehiani, M., Vilalta-Clemente, A., Wilkinson, A. J., Le Boulbar, E., Shields, P. A., Starosta, B., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 21 Feb 2022, In: Journal of Applied Physics. 131, 7, 9 p., 075303.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Residual Strain 100%
  • Electrical Properties 100%
  • Microscopy 100%
  • Strain 100%
  • Growth 100%
  4 Citations (Scopus)

  41 Downloads (Pure)
• 2021

  Kikuchi pattern simulations of backscattered and transmitted electrons

  Winkelmann, A., Nolze, G., Cios, G., Tokarski, T., Bała, P., Hourahine, B. & Trager‐Cowan, C., 30 Nov 2021, In: Journal of Microscopy. 284, 2, p. 157-184 28 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Simulation 100%
  • Electron 100%
  • Diffraction 100%
  • Electrons 100%
  • Model 85%
  17 Citations (Scopus)

  88 Downloads (Pure)

• Correlation between deep-level defects and functional properties of β-(Sn_xGa_1-x)₂O₃ on Si photodetectors

  Hatipoglu, I., Hunter, D. A., Mukhopadhyay, P., Williams, M. S., Edwards, P. R., Martin, R. W., Schoenfeld, W. V. & Gunasekar, G. N., 28 Nov 2021, In: Journal of Applied Physics. 130, 20, 10 p., 204501.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Defect 100%
  • Correlation 100%
  • Photosensor 100%
  • Cathodoluminescence 66%
  • Nucleation 50%
  7 Citations (Scopus)

  23 Downloads (Pure)

• High figure‐of‐merit gallium oxide UV photodetector on silicon by molecular beam epitaxy: a path toward monolithic integration

  Mukhopadhyay, P., Hatipoglu, I., Sakthivel, T. S., Hunter, D. A., Gunasekar, N. K., Edwards, P. R., Martin, R. W., Seal, S. & Schoenfeld, W. V., 7 Apr 2021, In: Advanced Photonics Research. 2, 4, 13 p., 2000067.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Oxide 100%
  • Molecular Beam Epitaxy 100%
  • Silicon 100%
  • Gallium 100%
  • Time 100%
  34 Downloads (Pure)

• Origin of red emission in β-Ga₂O₃ analysed by cathodoluminescence and photoluminescence spectroscopy

  Naresh-Kumar, G., Macintyre, H., Shanthi, S., Edwards, P. R., Martin, R. W., Daivasigamani, K., Sasaki, K. & Kuramata, A., 28 Feb 2021, In: Physica Status Solidi B. 258, 2000465.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Photoluminescence 100%
  • Cathodoluminescence 100%
  • Temperature 66%
  • Vapor Phase Epitaxy 33%
  • Sapphire 33%
  33 Citations (Scopus)

  21 Downloads (Pure)
• 2020

  Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN

  Bruckbauer, J., Gong, Y., Jiu, L., Wallace, M. J., Ipsen, A., Bauer, S., Müller, R., Bai, J., Thonke, K., Wang, T., Trager-Cowan, C. & Martin, R. W., 20 Oct 2020, In: Journal of Physics D: Applied Physics. 54, 2, 7 p., 025107.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Growth 100%
  • Optical Properties 100%
  • Defects 100%
  • Optical Property 100%
  • Defect 100%
  4 Citations (Scopus)

  41 Downloads (Pure)

• Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

  Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J. & Smith, M. D. & 17 others, Enslin, J., Mehnke, F., Kneissl, M., Kuhn, C., Wernicke, T., Knauer, A., Hagedorn, S., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 5 Aug 2020, In: IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.

  Research output: Contribution to journal › Conference article › peer-review

  Open Access

  File

  • Electron 100%
  • Diffraction 100%
  • Contrast 100%
  • Scanning Electron Microscopy 100%
  • Imaging Technique 25%
  38 Downloads (Pure)

• Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11–22) green LEDs grown on silicon

  Zhao, X., Huang, K., Bruckbauer, J., Shen, S., Zhu, C., Fletcher, P., Feng, P., Cai, Y., Bai, J., Trager-Cowan, C., Martin, R. W. & Wang, T., 28 Jul 2020, In: Scientific Reports. 10, 1, 8 p., 12650.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Silicon 100%
  • Performance 100%
  • Growth 100%
  • Plane 66%
  • Substrates 33%
  8 Citations (Scopus)

  35 Downloads (Pure)

• Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope

  Naresh-Kumar, G., Alasamari, A., Kusch, G., Edwards, P. R., Martin, R. W., Mingard, K. P. & Trager-Cowan, C., 30 Jun 2020, In: Ultramicroscopy. 213, 26 p., 112977.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Metrology 100%
  • Diffraction 100%
  • Variations 100%
  • Electrons 100%
  • Crystal Defect 100%
  5 Citations (Scopus)

  46 Downloads (Pure)

• DFTB+, a software package for efficient approximate density functional theory based atomistic simulations

  Hourahine, B., Aradi, B., Blum, V., Bonafé, F., Buccheri, A., Camacho, C., Cevallos, C., Deshaye, M. Y., Dumitrică, T., Dominguez, A., Ehlert, S., Elstner, M., van der Heide, T., Hermann, J., Irle, S., Kranz, J. J., Köhler, C., Kowalczyk, T., Kubař, T. & Lee, I. S. & 19 others, Lutsker, V., Maurer, R. J., Min, S. K., Mitchell, I., Negre, C., Niehaus, T. A., Niklasson, A. M. N., Page, A. J., Pecchia, A., Penazzi, G., Persson, M. P., Řezáč, J., Sánchez, C. G., Sternberg, M., Stöhr, M., Stuckenberg, F., Tkatchenko, A., Yu, V. W.-Z. & Frauenheim, T., 31 Mar 2020, In: Journal of Chemical Physics. 152, 12, 19 p., 124101.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Simulation 100%
  • Software Package 100%
  • Density Functional Theory 100%
  • Hybrid Functionals 33%
  • Application 16%
  803 Citations (Scopus)

  35 Downloads (Pure)

• Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

  Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J. & Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P.-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Scanning Electron Microscopy 100%
  • Semiconductor Material 100%
  • Luminescence 100%
  • Cathodoluminescence 100%
  • Characterization 100%
  9 Citations (Scopus)

  41 Downloads (Pure)

• Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging

  Jablon, B. M., Mingard, K., Winkelmann, A., Naresh-Kumar, G., Hourahine, B. & Trager-Cowan, C., 29 Feb 2020, In: International Journal of Refractory Metals and Hard Materials. 87, 18 p., 105159.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Metal 100%
  • Tungsten Carbide 100%
  • Electrons 100%
  • Cobalt 100%
  • Contrast 100%
  17 Citations (Scopus)

  89 Downloads (Pure)

• Improving EBSD precision by orientation refinement with full pattern matching

  Winkelmann, A., Jablon, B. M., Tong, V. S., Trager-Cowan, C. & Mingard, K. P., 26 Feb 2020, In: Journal of Microscopy. 277, 2, p. 79-92 14 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Precision 100%
  • Matching 100%
  • Electron 100%
  • Diffraction 100%
  • Backscatter 100%
  32 Citations (Scopus)

  36 Downloads (Pure)

• Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates

  Bruckbauer, J., Trager-Cowan, C., Hourahine, B., Winkelmann, A., Vennéguès, P., Ipsen, A., Yu, X., Zhao, X., Wallace, M. J., Edwards, P. R., Naresh-Kumar, G., Hocker, M., Bauer, S., Müller, R., Bai, J., Thonke, K., Wang, T. & Martin, R. W., 17 Jan 2020, In: Journal of Applied Physics. 127, 3, 8 p., 035705.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Substrates 100%
  • Luminescence 100%
  • Dislocation 100%
  • Luminiscence Type 100%
  • Multiple Quantum Well 62%
  2 Citations (Scopus)

  30 Downloads (Pure)
• 2019

  Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

  Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J. & Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Scanning Electron Microscopy 100%
  • Semiconductor 100%
  • Thin Films 100%
  • Nitride Semiconductor 100%
  • Microscopy 50%
  9 Citations (Scopus)

  35 Downloads (Pure)

• Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope

  Naresh-Kumar, G., Bruckbauer, J., Winkelmann, A., Yu, X., Hourahine, B., Edwards, P. R., Wang, T., Trager-Cowan, C. & Martin, R. W., 12 Jun 2019, In: Nano Letters. 19, 6, p. 3863-3870 8 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Polarity 100%
  • Scanning Electron Microscopy 100%
  • Nanowire 100%
  • Molecular Wire 100%
  • Electron Backscatter Diffraction 40%
  17 Citations (Scopus)

  44 Downloads (Pure)
• 2018

  You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization

  Edwards, P. R., Naresh-Kumar, G., Kusch, G., Bruckbauer, J., Spasevski, L., Brasser, C. G., Wallace, M. J., Trager-Cowan, C. & Martin, R. W., 1 Aug 2018, In: Microscopy and Microanalysis. 24, S1, p. 2026-2027 2 p.

  Research output: Contribution to journal › Conference article › peer-review

  Open Access

  File

  • Electron Probe Microanalysis 100%
  • Semiconductor 100%
  • Nitride 100%
  • Microanalysis 100%
  • Probe 100%
  38 Downloads (Pure)
• 2017

  Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction

  Naresh-Kumar, G., Vilalta-Clemente, A., Jussila, H., Winkelmann, A., Nolze, G., Vespucci, S., Nagarajan, S., Wilkinson, A. J. & Trager-Cowan, C., 7 Sept 2017, In: Scientific Reports. 7, 10 p., 10916.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Electron Backscatter Diffraction 100%
  • Anti-Phase Domain 100%
  • Quantitative Imaging 100%
  • Antiphase Boundaries 100%
  • Scanning Electron Microscopy 33%
  20 Citations (Scopus)

  124 Downloads (Pure)