Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Trager-Cowan, Carol (Principal Investigator)
Gray, Alison (Co-investigator)
Hourahine, Ben (Co-investigator)

Project: Research

18 Article
2 Conference article

2 results

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2014

Electron channeling contrast imaging of defects in III-nitride semiconductors
Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A. & Oliver, R. A. & 6 others, Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. & Mingard, K. P., 1 Aug 2014, In: Microscopy and Microanalysis. 20, S3, p. 1024-1025 2 p.
Research output: Contribution to journal › Conference article › peer-review

Open Access
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1 Citation (Scopus)

93 Downloads (Pure)
Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables
Edwards, P. R., Wallace, M. J., Kusch, G., Naresh-Kumar, G., Bruckbauer, J., Trager-Cowan, C., O'Donnell, K. P. & Martin, R. W., Aug 2014, In: Microscopy and Microanalysis. 20, S3, p. 906-907 2 p.
Research output: Contribution to journal › Conference article › peer-review

Open Access
File

90 Downloads (Pure)