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2022
Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy
Naresh-Kumar, G., Edwards, P. R., Batten, T., Nouf-Allehiani, M., Vilalta-Clemente, A., Wilkinson, A. J., Le Boulbar, E., Shields, P. A., Starosta, B., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 21 Feb 2022, In: Journal of Applied Physics. 131, 7, 9 p., 075303.Research output: Contribution to journal › Article › peer-review
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2020
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J. & Enslin, J. & 17 others, , 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.Research output: Contribution to journal › Article › peer-review
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2019
Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J. & Mehnke, F. & 16 others, , 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.Research output: Contribution to journal › Article › peer-review
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2017
Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes
Le Boulbar, E. D., Priesol, J., Nouf-Allehiani, M., Naresh-Kumar, G., Fox, S., Trager-Cowan, C., Šatka, A., Allsopp, D. W. E. & Shields, P. A., 15 May 2017, In: Journal of Crystal Growth. p. 30-38 9 p.Research output: Contribution to journal › Article › peer-review
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Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
Winkelmann, A., Nolze, G., Vespucci, S., Gunasekar, N., Trager-Cowan, C., Vilalta-Clemente, A., Wilkinson, A. J. & Vos, M., 5 May 2017, (E-pub ahead of print) In: Journal of Microscopy. 17 p.Research output: Contribution to journal › Article › peer-review
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Diffractive triangulation of radiative point sources
Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K. P., Maneuski, D., O'Shea, V. & Winkelmann, A., 24 Mar 2017, (E-pub ahead of print) In: Applied Physics Letters. 110, 12, 5 p., 124103.Research output: Contribution to journal › Article › peer-review
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Exploring transmission Kikuchi diffraction using a Timepix detector
Vespucci, S., Winkelmann, A., Mingard, K., Maneuski, D., O'Shea, V. & Trager-Cowan, C., 27 Feb 2017, In: Journal of Instrumentation. 12, 9 p., C02075.Research output: Contribution to journal › Article › peer-review
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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In: Acta Materialia. 125, p. 125-135 11 p.Research output: Contribution to journal › Article › peer-review
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Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation
Smith, M. D., Thomson, D., Zubialevich, V. Z., Li, H., Naresh-Kumar, G., Trager-Cowan, C. & Parbrook, P. J., 31 Jan 2017, In: Physica Status Solidi A. 214, 1, 6 p., 1600353.Research output: Contribution to journal › Article › peer-review
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2016
Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
Naresh-Kumar, G., Thomson, D., Nouf-Allehiani, M., Bruckbauer, J., Edwards, P. R., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 15 Nov 2016, In: Materials Science in Semiconductor Processing. 55, p. 19-25 7 p.Research output: Contribution to journal › Article › peer-review
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Electron channelling contrast imaging for III-nitride thin film structures
Naresh-Kumar, G., Thomson, D., Nouf-Allehiani, M., Bruckbauer, J., Edwards, P. R., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 1 Jun 2016, In: Materials Science in Semiconductor Processing. 47, p. 44-50 7 p.Research output: Contribution to journal › Article › peer-review
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2015
Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns
Vespucci, S., Winkelmann, A., Naresh-Kumar, G., Mingard, K. P., Maneuski, D., Edwards, P. R., Day, A. P., O'Shea, V. & Trager-Cowan, C., 15 Nov 2015, In: Physical Review B (Condensed Matter). 92, 20, 9 p., 205301.Research output: Contribution to journal › Article › peer-review
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Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N
Kusch, G., Nouf-Allehiani, M., Mehnke, F., Kuhn, C., Edwards, P. R., Wernicke, T., Knauer, A., Kueller, V., Naresh-Kumar, G., Weyers, M., Kneissl, M., Trager-Cowan, C. & Martin, R. W., 17 Aug 2015, In: Applied Physics Letters. 107, 7, 4 p., 072103.Research output: Contribution to journal › Article › peer-review
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2014
Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors
Naresh-Kumar, G., Vilalta-Clemente, A., Pandey, S., Skuridina, D., Behmenburg, H., Gamarra, P., Patriarche, G., Vickridge, I., di Forte-Poisson, M. A., Vogt, P., Kneissl, M., Morales, M., Ruterana, P., Cavallini, A., Cavalcoli, D., Giesen, C., Heuken, M. & Trager-Cowan, C., Dec 2014, In: AIP Advances. 4, 12, 13 p., 127101.Research output: Contribution to journal › Article › peer-review
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Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN
Kusch, G., Li, H., Edwards, P. R., Bruckbauer, J., Sadler, T. C., Parbrook, P. J. & Martin, R. W., 3 Mar 2014, In: Applied Physics Letters. 104, 9, 4 p., 092114 .Research output: Contribution to journal › Article › peer-review
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Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN
Naresh-Kumar, G., Bruckbauer, J., Edwards, P. R., Kraeusel, S., Hourahine, B., Martin, R. W., Kappers, M. J., Moram, M. A., Lovelock, S., Oliver, R. A., Humphreys, C. J. & Trager-Cowan, C., Feb 2014, In: Microscopy and Microanalysis. 20, 1, p. 55-60 6 p.Research output: Contribution to journal › Article › peer-review
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2013
Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope
Naresh Kumar, G., Mauder, C., Wang, K. R., Kraeusel, S., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kalisch, H., Vescan, A., Giesen, C., Heuken, M., Trampert, A., Day, A. P. & Trager-Cowan, C., 8 Apr 2013, In: Applied Physics Letters. 102, 14, 4 p., 142103.Research output: Contribution to journal › Article › peer-review
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Stress distribution of GaN layer grown on micro-pillar patterned GaN templates
Nagarajan, S., Svensk, O., Ali, M., Naresh-Kumar, G., Trager-Cowan, C., Suihkonen, S., Sopanen, M. & Lipsanen, H., 2013, In: Applied Physics Letters. 103, 1, 4 p., 012102.Research output: Contribution to journal › Article › peer-review
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