Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Research output

Research output per year 2013 2014 2017 2022

• 18 Article
• 2 Conference article

Research output per year

Research output per year

Search results

• 2022

  Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy

  Naresh-Kumar, G., Edwards, P. R., Batten, T., Nouf-Allehiani, M., Vilalta-Clemente, A., Wilkinson, A. J., Le Boulbar, E., Shields, P. A., Starosta, B., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 21 Feb 2022, In: Journal of Applied Physics. 131, 7, 9 p., 075303.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Residual Strain 100%
  • Electrical Properties 100%
  • Microscopy 100%
  • Strain 100%
  • Growth 100%
  2 Citations (Scopus)

  40 Downloads (Pure)
• 2020

  Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

  Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J. & Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P.-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Scanning Electron Microscopy 100%
  • Semiconductor Material 100%
  • Luminescence 100%
  • Cathodoluminescence 100%
  • Characterization 100%
  7 Citations (Scopus)

  39 Downloads (Pure)
• 2019

  Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

  Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J. & Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Scanning Electron Microscopy 100%
  • Semiconductor 100%
  • Thin Films 100%
  • Nitride Semiconductor 100%
  • Microscopy 50%
  9 Citations (Scopus)

  34 Downloads (Pure)
• 2017

  Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes

  Le Boulbar, E. D., Priesol, J., Nouf-Allehiani, M., Naresh-Kumar, G., Fox, S., Trager-Cowan, C., Šatka, A., Allsopp, D. W. E. & Shields, P. A., 15 May 2017, In: Journal of Crystal Growth. p. 30-38 9 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Fabrication 100%
  • Growth 100%
  • Dislocation 100%
  • Density 50%
  • Flat Surfaces 21%
  9 Citations (Scopus)

  138 Downloads (Pure)

• Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications

  Winkelmann, A., Nolze, G., Vespucci, S., Gunasekar, N., Trager-Cowan, C., Vilalta-Clemente, A., Wilkinson, A. J. & Vos, M., 5 May 2017, (E-pub ahead of print) In: Journal of Microscopy. 17 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Utilization 100%
  • Diffraction 100%
  • Electrons 100%
  • Electron Transport 100%
  • Application 100%
  13 Citations (Scopus)

  232 Downloads (Pure)

• Diffractive triangulation of radiative point sources

  Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K. P., Maneuski, D., O'Shea, V. & Winkelmann, A., 24 Mar 2017, (E-pub ahead of print) In: Applied Physics Letters. 110, 12, 5 p., 124103.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Diffraction Pattern 100%
  • Position (Location) 100%
  • Point Source 100%
  • Diffraction 100%
  • Detection 50%
  5 Citations (Scopus)

  65 Downloads (Pure)

• Exploring transmission Kikuchi diffraction using a Timepix detector

  Vespucci, S., Winkelmann, A., Mingard, K., Maneuski, D., O'Shea, V. & Trager-Cowan, C., 27 Feb 2017, In: Journal of Instrumentation. 12, 9 p., C02075.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Diffraction 100%
  • Detector 100%
  • Scanning Electron Microscopy 66%
  • Electron 66%
  • Electrons 55%
  11 Citations (Scopus)

  102 Downloads (Pure)

• Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

  Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In: Acta Materialia. 125, p. 125-135 11 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Backscatter 100%
  • Cross Correlation 100%
  • Diffraction 100%
  • High Resolution 100%
  • Electrons 100%
  48 Citations (Scopus)

  197 Downloads (Pure)

• Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation

  Smith, M. D., Thomson, D., Zubialevich, V. Z., Li, H., Naresh-Kumar, G., Trager-Cowan, C. & Parbrook, P. J., 31 Jan 2017, In: Physica Status Solidi A. 214, 1, 6 p., 1600353.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Fissure 100%
  • Nanoscale 100%
  • Heterojunction 100%
  • Surface Properties 33%
  • Stability 22%
  6 Citations (Scopus)

  33 Downloads (Pure)
• 2016

  Reprint of: Electron channelling contrast imaging for III-nitride thin film structures

  Naresh-Kumar, G., Thomson, D., Nouf-Allehiani, M., Bruckbauer, J., Edwards, P. R., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 15 Nov 2016, In: Materials Science in Semiconductor Processing. 55, p. 19-25 7 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Electrons 100%
  • Thin Films 100%
  • Contrast 100%
  • Electron 100%
  • Electron Particle 100%
  19 Downloads (Pure)

• Electron channelling contrast imaging for III-nitride thin film structures

  Naresh-Kumar, G., Thomson, D., Nouf-Allehiani, M., Bruckbauer, J., Edwards, P. R., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 1 Jun 2016, In: Materials Science in Semiconductor Processing. 47, p. 44-50 7 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Electrons 100%
  • Thin Films 100%
  • Contrast 100%
  • Electron 100%
  • Scanning Electron Microscopy 100%
  20 Citations (Scopus)

  136 Downloads (Pure)
• 2015

  Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

  Vespucci, S., Winkelmann, A., Naresh-Kumar, G., Mingard, K. P., Maneuski, D., Edwards, P. R., Day, A. P., O'Shea, V. & Trager-Cowan, C., 15 Nov 2015, In: Physical Review B (Condensed Matter). 92, 20, 9 p., 205301.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Diffraction Pattern 100%
  • Backscatter 100%
  • Electrons 100%
  • Electron 100%
  • Energy 100%
  43 Citations (Scopus)

  394 Downloads (Pure)

• Spatial clustering of defect luminescence centers in Si-doped low resistivity Al_0.82Ga_0.18N

  Kusch, G., Nouf-Allehiani, M., Mehnke, F., Kuhn, C., Edwards, P. R., Wernicke, T., Knauer, A., Kueller, V., Naresh-Kumar, G., Weyers, M., Kneissl, M., Trager-Cowan, C. & Martin, R. W., 17 Aug 2015, In: Applied Physics Letters. 107, 7, 4 p., 072103.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Electrical Resistivity 100%
  • Luminescence 100%
  • Defects 100%
  • Defect 100%
  • Electrons 50%
  23 Citations (Scopus)

  142 Downloads (Pure)
• 2014

  Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors

  Naresh-Kumar, G., Vilalta-Clemente, A., Pandey, S., Skuridina, D., Behmenburg, H., Gamarra, P., Patriarche, G., Vickridge, I., di Forte-Poisson, M. A., Vogt, P., Kneissl, M., Morales, M., Ruterana, P., Cavallini, A., Cavalcoli, D., Giesen, C., Heuken, M. & Trager-Cowan, C., Dec 2014, In: AIP Advances. 4, 12, 13 p., 127101.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Transistor 100%
  • Vapor Phase Epitaxy 100%
  • Heterojunction 100%
  • Electron Mobility 100%
  • High Electron Mobility Transistors 100%
  15 Citations (Scopus)

  107 Downloads (Pure)

• Electron channeling contrast imaging of defects in III-nitride semiconductors

  Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A. & Oliver, R. A. & 6 others, Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. & Mingard, K. P., 1 Aug 2014, In: Microscopy and Microanalysis. 20, S3, p. 1024-1025 2 p.

  Research output: Contribution to journal › Conference article › peer-review

  Open Access

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  1 Citation (Scopus)

  93 Downloads (Pure)

• Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

  Edwards, P. R., Wallace, M. J., Kusch, G., Naresh-Kumar, G., Bruckbauer, J., Trager-Cowan, C., O'Donnell, K. P. & Martin, R. W., Aug 2014, In: Microscopy and Microanalysis. 20, S3, p. 906-907 2 p.

  Research output: Contribution to journal › Conference article › peer-review

  Open Access

  File
  90 Downloads (Pure)

• Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN

  Kusch, G., Li, H., Edwards, P. R., Bruckbauer, J., Sadler, T. C., Parbrook, P. J. & Martin, R. W., 3 Mar 2014, In: Applied Physics Letters. 104, 9, 4 p., 092114 .

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Substrate 100%
  • Morphology 100%
  • Luminescence 100%
  • Substrates 100%
  • Surface Morphology 100%
  21 Citations (Scopus)

  206 Downloads (Pure)

• Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN

  Naresh-Kumar, G., Bruckbauer, J., Edwards, P. R., Kraeusel, S., Hourahine, B., Martin, R. W., Kappers, M. J., Moram, M. A., Lovelock, S., Oliver, R. A., Humphreys, C. J. & Trager-Cowan, C., Feb 2014, In: Microscopy and Microanalysis. 20, 1, p. 55-60 6 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Electrons 100%
  • Cathodoluminescence 100%
  • Dislocation 100%
  • Images 30%
  • Region 15%
  30 Citations (Scopus)

  187 Downloads (Pure)
• 2013

  Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

  Naresh Kumar, G., Mauder, C., Wang, K. R., Kraeusel, S., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kalisch, H., Vescan, A., Giesen, C., Heuken, M., Trampert, A., Day, A. P. & Trager-Cowan, C., 8 Apr 2013, In: Applied Physics Letters. 102, 14, 4 p., 142103.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Dislocation 100%
  • Nitride Compound 100%
  • Scanning Electron Microscopy 100%
  • Electrons 100%
  • Contrast 100%
  16 Citations (Scopus)

  155 Downloads (Pure)

• Stress distribution of GaN layer grown on micro-pillar patterned GaN templates

  Nagarajan, S., Svensk, O., Ali, M., Naresh-Kumar, G., Trager-Cowan, C., Suihkonen, S., Sopanen, M. & Lipsanen, H., 2013, In: Applied Physics Letters. 103, 1, 4 p., 012102.

  Research output: Contribution to journal › Article › peer-review

  Open Access

  File

  • Boundaries 100%
  • Region 100%
  • Stress Distribution 100%
  • Dislocation 100%
  • Differences 50%
  14 Citations (Scopus)

  223 Downloads (Pure)