Activities per year
- 18 results
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Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures
Trager-Cowan, C. (Invited speaker), Bruckbauer, J. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Alasmari, A. M. A. (Contributor), Gunasekar, N. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
10 Jun 2024Activity: Talk or presentation types › Invited talk
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Invited Talk: Materials Research Society Fall Meeting, US, December 2023. Title: Pushing the Limits of Diffraction Imaging in the Scanning Electron Microscope for the Structural Characterisation of Semiconductor Thin Films and Microstructures
Trager-Cowan, C. (Speaker), Bruckbauer, J. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
1 Dec 2023Activity: Talk or presentation types › Invited talk
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Invited Talk: EMAG 2020 Microscopy Enabled by Direct Electron Detection (on-line). Title: Direct electron detectors for diffraction studies in the scanning electron microscope
Trager-Cowan, C. (Speaker)
6 Jul 2020 → 8 Jul 2020Activity: Talk or presentation types › Invited talk
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Invited Talk: SPIE Photonics West Conference: Gallium Nitride Materials and Devices XV, US, February 2020. Title: Visualization of defects in nitride semiconductors by electron channeling.
Trager-Cowan, C. (Speaker)
4 Feb 2020Activity: Talk or presentation types › Invited talk
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Invited talk:CAM-IES Workshop: Multi-Modal Characterisation of Energy Materials, UK, November 2019 Title: Investigating crystal structure, defects and luminescence from optoelectronic materials in the scanning electron microscope
Trager-Cowan, C. (Speaker)
6 Nov 2019Activity: Talk or presentation types › Invited talk
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Invited talk: mmc2019 EMAG, UK, July 2019 Title: Electron backscatter diffraction - exploring the structural properties of materials in the scanning electron microscope
Trager-Cowan, C. (Speaker)
2 Jul 2019Activity: Talk or presentation types › Invited talk
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Invited talk:EMAS 2019 - 16th European Workshop on Modern Developments and Applications in Microbeam Analysis, Norway, May 2019 Title: Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C. (Speaker)
20 May 2019Activity: Talk or presentation types › Invited talk
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Invited talk: 21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI), UK, April 2019 Title: Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C. (Speaker)
12 Apr 2019Activity: Talk or presentation types › Invited talk
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Invited talk: The Royal Microscopical Society Electron Backscatter Diffraction Conference, UK, April 2019 Title: Visualisation and investigation of defects using electron channelling (electron diffraction) in the scanning electron microscope.
Trager-Cowan, C. (Speaker)
3 Apr 2019Activity: Talk or presentation types › Invited talk
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Invited talk: International Workshop on Nitride Semiconductor, Japan, November 2018 Title: Visualization and investigation of defects using electron channeling (electron diffraction) in the scanning electron microscope
Trager-Cowan, C. (Speaker)
14 Nov 2018Activity: Talk or presentation types › Invited talk
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Invited talk: State-of-the-art trends of scientific research of artificial and natural nanoobjects (STRANN), Russia, October 2018 Title: Investigating the Structural and Luminescence Properties of Semiconductors in the Scanning Electron Microscope
Trager-Cowan, C. (Speaker)
17 Oct 2018Activity: Talk or presentation types › Invited talk
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Invited talk: Gordon Research Conference on Defects in Semiconductors, New London, US, August 2018 Title: Investigating the Structural and Luminescence Properties of Semiconductors in the Scanning Electron Microscope
Trager-Cowan, C. (Speaker)
22 Aug 2018Activity: Talk or presentation types › Invited talk
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Plenary Lecture: International Workshop on Advance Materials and Device Technology, Chennai, India, November 2017 Title: Characterisation of the structural and luminescence properties of nitride materials in the scanning electron microscope
Trager-Cowan, C. (Speaker)
Nov 2017Activity: Talk or presentation types › Invited talk
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Invited Talk: International Workshop on UV Materials and Devices 2017, Fukuoka, Japan, November 2017 Title: Nanocharacterisation of the structural and luminescence properties of UV light-emitting materials in the scanning electron microscope
Trager-Cowan, C. (Speaker)
Nov 2017Activity: Talk or presentation types › Invited talk
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Invited Talk: 12th International Conference on Nitride Semiconductors, Strasbourg, France, July, 2017 Title: Novel scanning electron microscopy techniques for rapid structural characterisation of III-N films.
Trager-Cowan, C. (Speaker)
Jul 2017Activity: Talk or presentation types › Invited talk
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Lecture Series in India as part of "Science and Beyond" organised by the British Council, January 2016. Gave talks on - "Studying structure and light emission in the scanning electron microscope" and "Engaging the Public with Science and Technology – from statues to rainbows"
Trager-Cowan, C. (Invited speaker)
10 Jan 2016 → 20 Jan 2016Activity: Talk or presentation types › Invited talk
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Lecture at the Birla Industrial and Technological Museum (BITM), Kolkata, India, January 2015 "Nitrides - The Rainbow Material"
Trager-Cowan, C. (Speaker)
18 Jan 2016Activity: Talk or presentation types › Invited talk
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Maxwell Lecture at King's College London, March 2015 "Nitrides – The Rainbow Material"
Trager-Cowan, C. (Speaker)
2 Mar 2015Activity: Talk or presentation types › Invited talk