Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Trager-Cowan, Carol (Principal Investigator)
Gray, Alison (Co-investigator)
Hourahine, Ben (Co-investigator)

Project: Research

18 Invited talk
3 Participation in conference
1 Organiser of major conference

3 results
- Title
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German Physical Society Spring Meeting, Regensburg, Germany. March 2016. Title: Nanocharacterisation of the structural and luminescence properties of materials in the scanning electron microscope
Trager-Cowan, C. (Invited speaker)
8 Mar 2016
Activity: Participating in or organising an event types › Participation in conference
Invited talk at the Extended Defects in Semiconductors Conference, Gottingen, Germany, September 2014. Title: Electron Channelling Contrast Imaging of Extended Defects
Trager-Cowan, C. (Invited speaker)
Sept 2014
Activity: Participating in or organising an event types › Participation in conference
Invited talk at the Microscopy and Microanalysis Conference, Hartford, USA, August 2014. Title: Defect Imaging in the Scanning Electron Microscope - Electron Channelling Contrast Imaging of defects in III-nitride semiconductors
Trager-Cowan, C. (Invited speaker)
Aug 2014
Activity: Participating in or organising an event types › Participation in conference