Manufacturing of nano-engineered III-nitride semiconductors

Martin, Robert (Principal Investigator)
Trager-Cowan, Carol (Co-investigator)

Physics

Project: Research

32 Article
2 Conference article

2 results

Filter

2020
Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J., Smith, M. D., & 17 othersEnslin, J., Mehnke, F., Kneissl, M., Kuhn, C., Wernicke, T., Knauer, A., Hagedorn, S., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 5 Aug 2020, In: IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.
Research output: Contribution to journal › Conference article › peer-review

Open Access
File
35 Downloads (Pure)
2018
You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization
Edwards, P. R., Naresh-Kumar, G., Kusch, G., Bruckbauer, J., Spasevski, L., Brasser, C. G., Wallace, M. J., Trager-Cowan, C. & Martin, R. W., 1 Aug 2018, In: Microscopy and Microanalysis. 24, S1, p. 2026-2027 2 p.
Research output: Contribution to journal › Conference article › peer-review

Open Access
File
36 Downloads (Pure)