Engineering & Materials Science
Cathodoluminescence
100%
Nanorods
93%
Electrons
76%
Semiconductor quantum wells
60%
Nitrides
59%
Light emitting diodes
57%
Electron microscopes
51%
Imaging techniques
49%
Electron diffraction
46%
Scanning
44%
Semiconductor materials
37%
Vapor phase epitaxy
34%
Thin films
34%
Nanostructures
32%
Light emission
32%
Defects
31%
Fabrication
30%
Chemical analysis
29%
Hyperspectral imaging
28%
Luminescence
28%
Diffraction
25%
Crystal defects
24%
Scanning electron microscopy
24%
Characterization (materials science)
24%
Doping (additives)
21%
Diffraction patterns
20%
Sapphire
20%
Gallium nitride
19%
Growth temperature
19%
Wavelength
18%
Metallorganic vapor phase epitaxy
18%
Ultraviolet radiation
17%
Indium
17%
Optical properties
17%
Aluminum nitride
16%
Stark effect
16%
Metals
15%
Nanowires
15%
Scaffolds
15%
Electron beams
14%
Dry etching
14%
Crystals
14%
Electron probe microanalysis
13%
X-Ray Emission Spectrometry
13%
Spectroscopy
12%
Transmission electron microscopy
11%
Energy gap
11%
Crystal orientation
11%
Lithography
11%
Crystal structure
10%
Masks
9%
X rays
9%
Detectors
9%
Wet etching
9%
Quantum efficiency
8%
Semiconductor lasers
8%
High resolution transmission electron microscopy
8%
Atomic force microscopy
7%
Etching
7%
Optoelectronic devices
6%
Adatoms
6%
Epitaxial growth
6%
Structural properties
5%
Topography
5%
Metallorganic chemical vapor deposition
5%
Electroluminescence
5%
Defect density
5%
Impurities
5%
Trace elements
5%
Physics & Astronomy
cathodoluminescence
82%
nanorods
70%
nitrides
57%
quantum wells
48%
electrons
45%
electron microscopes
44%
light emitting diodes
44%
flat surfaces
42%
defects
40%
vapor phase epitaxy
38%
scanning
37%
crystal defects
35%
light emission
35%
optical properties
33%
luminescence
29%
diffraction
28%
templates
27%
thin films
24%
characterization
23%
fabrication
23%
scanning electron microscopy
22%
wavelengths
20%
electrical properties
18%
metals
17%
gallium nitrides
17%
indium
16%
crystals
16%
sapphire
16%
emitters
15%
etching
14%
aluminum nitrides
14%
electron beams
13%
electron diffraction
12%
bows
11%
polarity
11%
electron probes
11%
microanalysis
11%
transmission electron microscopy
10%
x ray spectroscopy
10%
misalignment
10%
metrology
10%
x rays
10%
nanowires
9%
excitons
9%
energy
9%
diffraction patterns
8%
platforms
8%
inhomogeneity
8%
atomic force microscopy
7%
engineering
7%
spectroscopy
7%
crystal structure
7%
color
7%
microscopy
7%
lithography
7%
Stark effect
6%
detectors
6%
homogeneity
6%
tungsten carbides
6%
rods
6%
electron counters
5%
electron distribution
5%
shift
5%
optoelectronic devices
5%
photoluminescence
5%
imaging techniques
5%
Chemical Compounds
Cathodoluminescence
62%
Nanorod
55%
Electron Particle
40%
Electron Backscatter Diffraction
40%
Nitride
38%
Vapor Phase Epitaxy
34%
Threading Dislocation
30%
Semiconductor
26%
Strain
17%
Quantum-Confined Stark Effect
16%
Metallorganic Chemical Vapour Deposition
16%
Aluminium Nitride
15%
Nanomaterial
15%
Scanning Electron Microscopy
13%
Etching
13%
Crystal Defect
12%
Luminiscence Type
11%
Nanowire
11%
Crystal Orientation
10%
Optoelectronics
10%
Polarity
10%
Pressure
9%
Wavelength
9%
Reduction
9%
Homogeneity
9%
Wavelength Dispersive X-Ray Spectroscopy
8%
Displacement
8%
Band Gap
7%
Optical Property
7%
Surface
7%
Alloy
7%
Stacking Fault
7%
Epitaxial Growth
6%
Misfit Dislocation
6%
Length
6%
Doping Material
6%
Phonon
5%
Crystal Line Defect
5%
Coalescence
5%
Hexagonal Space Group
5%
Grain Boundary
5%
Energy
5%
Striated Crystal
5%