Improving resolution and sensitivity for crystallographic analysis in the scanning electron microscope

Status	Finished
Effective start/end date	1/11/21 → 31/10/23

Strain and luminescence properties of hexagonal hillocks in N-polar GaN
Bruckbauer, J., Cios, G., Sarua, A., Feng, P., Wang, T., Hourahine, B., Winkelmann, A., Trager-Cowan, C. & Martin, R., 16 Mar 2025, (Accepted/In press) In: Journal of Applied Physics.
Research output: Contribution to journal › Article › peer-review
Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction
Waters, D. M., Thompson, B., Ferenczi, G., Hourahine, B., Cios, G., Winkelmann, A., Stark, C. J. M., Wetzel, C., Trager-Cowan, C. & Bruckbauer, J., 27 Jan 2025, In: Journal of Applied Physics. 137, 4, 13 p., 045701.
Research output: Contribution to journal › Article › peer-review

Open Access
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3 Downloads (Pure)
Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction
Hiller, K. P., Winkelmann, A., Hourahine, B., Starosta, B., Alasmari, A., Feng, P., Wang, T., Parbrook, P. J., Zubialevich, V. Z., Hagedorn, S., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Bruckbauer, J. & Trager-Cowan, C., 31 Dec 2023, In: Microscopy and Microanalysis. 29, 6, p. 1879-1888 10 p.
Research output: Contribution to journal › Article › peer-review

Open Access
File
1 Citation (Scopus)

57 Downloads (Pure)

Data for: "Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction"
Hiller, K. (Contributor), Winkelmann, A. (Contributor), Hourahine, B. (Creator), Starosta, B. (Contributor), Alasmari, A. M. A. (Contributor), Feng, P. (Contributor), Wang, T. (Contributor), Parbrook, P. (Contributor), Zubialevich, V. Z. (Contributor), Hagedorn, S. (Contributor), Walde, S. (Contributor), Weyers, M. (Contributor), Coulon, P.-M. (Contributor), Shields, P. A. (Contributor), Trager-Cowan, C. (Supervisor) & Bruckbauer, J. (Creator), University of Strathclyde, 3 Nov 2023
DOI: 10.15129/318a308b-13f6-4e0e-a3e6-4c69e7e70da1
Dataset
Data for "Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction"
Waters, D. (Creator), Cios, G. (Contributor) & Bruckbauer, J. (Supervisor), University of Strathclyde, 7 Jan 2025
DOI: 10.15129/1f65afc8-bc9d-4537-b016-76d55319eddb
Dataset

Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures
Trager-Cowan, C. (Invited speaker), Bruckbauer, J. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Alasmari, A. M. A. (Contributor), Gunasekar, N. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
10 Jun 2024
Activity: Talk or presentation types › Invited talk
Oxford Instruments EBSD User meeting 2024
Bruckbauer, J. (Speaker)
16 May 2024
Activity: Participating in or organising an event types › Participation in conference
AGH University of Krakow
Bruckbauer, J. (Visiting researcher)
18 Mar 2024 → 27 Mar 2024
Activity: Visiting an external institution types › Visiting an external academic institution

Project Details