Corbett Prize

Prize: Prize (including medals and awards)

Description

Awarded every four years to a young scientist for an outstanding contribution at the International
Conference of Defects in Semiconductors, Japan
Awarded date20 Aug 2017
Degree of recognitionInternational

Prize (including medals and awards)

eventInternational Conference of Defects in Semiconductors
locationMatsue, Japan
Period3 Aug 2017

Fingerprint

Japan
defects

Documents & Links

Related content

Activities

Characterization of threading dislocations in nitrides by modelling contrast profiles observed in electron channelling contrast images

Activity: Talk or presentation types › Oral presentation

Projects

Industrial Case Account 2014 | Pascal, Elena

Project: Research Studentship - Internally Allocated › Research Studentship (Internally Allocated)