Trager-Cowan, C., Alasmari, A., Avis, W.,
Bruckbauer, J.,
Edwards, P. R., Ferenczi, G.,
Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G.,
Martin, R. W.,
McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J.,
& 17 othersMehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A.,
25 Mar 2020,
In: Semiconductor Science and Technology. 35,
5,
15 p., 054001.
Research output: Contribution to journal › Article › peer-review