Projects per year
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Dive into the research topics where Ryan McDermott is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Projects
- 1 Finished
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Doctoral Training Partnership (DTP 2016-2017 University of Strathclyde) | McDermott, Ryan
Trager-Cowan, C. (Principal Investigator), Martin, R. (Co-investigator) & McDermott, R. (Research Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/10/17 → 1/10/21
Project: Research Studentship - Internally Allocated
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Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J. & Smith, M. D. & 17 others, , 5 Aug 2020, In: IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile38 Downloads (Pure) -
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J. & Enslin, J. & 17 others, , 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.Research output: Contribution to journal › Article › peer-review
Open AccessFile9 Citations (Scopus)41 Downloads (Pure)
Activities
- 2 Invited talk
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Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures
Trager-Cowan, C. (Invited speaker), Bruckbauer, J. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Alasmari, A. M. A. (Contributor), Gunasekar, N. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
10 Jun 2024Activity: Talk or presentation types › Invited talk
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Invited Talk: Materials Research Society Fall Meeting, US, December 2023. Title: Pushing the Limits of Diffraction Imaging in the Scanning Electron Microscope for the Structural Characterisation of Semiconductor Thin Films and Microstructures
Trager-Cowan, C. (Speaker), Bruckbauer, J. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
1 Dec 2023Activity: Talk or presentation types › Invited talk