Ryan McDermott

Physics

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Doctoral Training Partnership (DTP 2016-2017 University of Strathclyde) | McDermott, Ryan
Trager-Cowan, C., Martin, R. & McDermott, R.
EPSRC (Engineering and Physical Sciences Research Council)
1/10/17 → 1/07/21
Project: Research Studentship - Internally Allocated

2 Article
1 Conference article

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J., Smith, M. D. & 17 others, Enslin, J., Mehnke, F., Kneissl, M., Kuhn, C., Wernicke, T., Knauer, A., Hagedorn, S., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 5 Aug 2020, In : IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.
Research output: Contribution to journal › Conference article

Open Access
File
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In : Semiconductor Science and Technology. 35, 5, 15 p., 054001.
Research output: Contribution to journal › Article

Open Access
File
1 Citation (Scopus)

3 Downloads (Pure)

Doctoral Training Partnership (DTP 2016-2017 University of Strathclyde) | McDermott, Ryan

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope