Research output per year
Research output per year
Search results
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2020
Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J. & Smith, M. D. & 17 others, , 5 Aug 2020, In: IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile38 Downloads (Pure) -
2018
You do what in your microprobe?! The EPMA as a multimode platform for nitride semiconductor characterization
Edwards, P. R., Naresh-Kumar, G., Kusch, G., Bruckbauer, J., Spasevski, L., Brasser, C. G., Wallace, M. J., Trager-Cowan, C. & Martin, R. W., 1 Aug 2018, In: Microscopy and Microanalysis. 24, S1, p. 2026-2027 2 p.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile38 Downloads (Pure) -
2014
Electron channeling contrast imaging of defects in III-nitride semiconductors
Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A. & Oliver, R. A. & 6 others, , 1 Aug 2014, In: Microscopy and Microanalysis. 20, S3, p. 1024-1025 2 p.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile1 Citation (Scopus)94 Downloads (Pure) -
Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables
Edwards, P. R., Wallace, M. J., Kusch, G., Naresh-Kumar, G., Bruckbauer, J., Trager-Cowan, C., O'Donnell, K. P. & Martin, R. W., Aug 2014, In: Microscopy and Microanalysis. 20, S3, p. 906-907 2 p.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile91 Downloads (Pure) -
2012
Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
Trager-Cowan, C., Gunasekar, N., Hourahine, B., Edwards, P., Bruckbauer, J., Martin, R., Mauder, C., Day, A., England, G., Winkelmann, A., Parbrook, P. & Wilkinson, A., 2012, In: Microscopy and Microanalysis. 18, S2, p. 684-685 2 p.Research output: Contribution to journal › Conference article › peer-review
1 Citation (Scopus) -
2007
Double dielectric mirror InGaN/GaN microactivities formed using selective removal of an AlInN layer
Rizzi, F., Edwards, P. R., Bejtka, K., Semond, F., Gu, E., Dawson, M. D., Watson, I. M. & Martin, R. W., Jun 2007, In: Superlattices and Microstructures. 41, 5-6, p. 414 1 p.Research output: Contribution to journal › Conference article › peer-review
1 Citation (Scopus) -
2005
Site multiplicity of rare earth ions in III-nitrides
O'Donnell, K. P., Katchkanov, V., Wang, K., Martin, R. W., Edwards, P. R., Hourahine, B., Nogales, E., Mosselmans, J. F. W. & De Vries, B., 25 Aug 2005, In: Materials Research Society Symposium Proceedings. 831, p. 527-536 10 p., E9.6.Research output: Contribution to journal › Conference article › peer-review
6 Citations (Scopus) -
2004
Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures
Edwards, P. R., Martin, R. W., O'Donnell, K. P. & Watson, I. M., 17 Nov 2004, In: Design and Nature. 6, p. 293-296 4 p.Research output: Contribution to journal › Conference article › peer-review
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2003
Electron micro-probe analysis and cathodoluminescence spectroscopy of rare earth - Implanted GaN
Dalmasso, S., Martin, R. W., Edwards, P. R., Katchkanov, V., O'Donnell, K. P., Lorenz, K., Alves, E., Wahl, U., Pipeleers, B., Matias, V., Vantomme, A., Nakanishi, Y., Wakahara, A. & Yoshida, A., 1 Dec 2003, In: Materials Research Society Symposium - Proceedings. 798, p. 429-434 6 p.Research output: Contribution to journal › Conference article › peer-review