Naresh Gunasekar

Dr

  • United Kingdom

20122020

Research output per year

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Research Output

2020

AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy

Walde, S., Hagedorn, S., Coulon, P-M., Mogilatenko, A., Netzel, C., Weinrich, J., Susilo, N., Ziffer, E., Matiwe, L., Hartmann, C., Kusch, G., Alasmari, A., Naresh-Kumar, G., Trager-Cowan, C., Wernicke, T., Straubinger, T., Bickermann, M., Martin, R. W., Shields, P. A., Kneissl, M. & 1 others, Weyers, M., 1 Feb 2020, In : Journal of Crystal Growth. 531, 6 p., 125343.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Luminescence behavior of semipolar (10 11) InGaN/GaN "bow-tie" structures on patterned Si substrates

Bruckbauer, J., Trager-Cowan, C., Hourahine, B., Winkelmann, A., Vennéguès, P., Ipsen, A., Yu, X., Zhao, X., Wallace, M. J., Edwards, P. R., Naresh-Kumar, G., Hocker, M., Bauer, S., Müller, R., Bai, J., Thonke, K., Wang, T. & Martin, R. W., 17 Jan 2020, In : Journal of Applied Physics. 127, 3, 8 p., 035705.

Research output: Contribution to journalArticle

Open Access
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2 Downloads (Pure)

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In : Semiconductor Science and Technology. 35, 5, 15 p., 054001.

Research output: Contribution to journalArticle

Open Access
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1 Downloads (Pure)
3 Citations (Scopus)
2019
Open Access
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3 Citations (Scopus)
15 Downloads (Pure)

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In : Photonics Research. 7, 11, p. B73-B82 10 p.

Research output: Contribution to journalArticle

Open Access
File
2 Citations (Scopus)
2018

Dislocation contrast in electron channelling contrast images as projections of strain-like components

Pascal, E., Hourahine, B., Naresh-Kumar, G., Mingard, K. & Trager-Cowan, C., 12 Jun 2018, In : Materials Today: Proceedings. 5, Issue 6, Part 3, p. 14652–14661 10 p.

Research output: Contribution to journalArticle

Open Access
File
4 Citations (Scopus)
21 Downloads (Pure)

Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

Naresh-Kumar, G., Thomson, D., Zhang, Y., Bai, J., Jiu, L., Yu, X., Gong, Y. P., Martin, R. S., Wang, T. & Trager-Cowan, C., 10 Aug 2018, In : Journal of Applied Physics. 124, 6, 6 p., 065301.

Research output: Contribution to journalArticle

Open Access
File
2 Citations (Scopus)
11 Downloads (Pure)
Open Access
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9 Downloads (Pure)
2017

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In : Acta Materialia. 125, p. 125-135 11 p.

Research output: Contribution to journalArticle

Open Access
File
3 Citations (Scopus)
174 Downloads (Pure)

Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes

Le Boulbar, E. D., Priesol, J., Nouf-Allehiani, M., Naresh-Kumar, G., Fox, S., Trager-Cowan, C., Šatka, A., Allsopp, D. W. E. & Shields, P. A., 15 May 2017, In : Journal of Crystal Growth. p. 30-38 9 p.

Research output: Contribution to journalArticle

Open Access
File
5 Citations (Scopus)
109 Downloads (Pure)

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications

Winkelmann, A., Nolze, G., Vespucci, S., Gunasekar, N., Trager-Cowan, C., Vilalta-Clemente, A., Wilkinson, A. J. & Vos, M., 5 May 2017, In : Journal of Microscopy. 17 p.

Research output: Contribution to journalArticle

Open Access
File
8 Citations (Scopus)
213 Downloads (Pure)

Diffractive triangulation of radiative point sources

Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K. P., Maneuski, D., O'Shea, V. & Winkelmann, A., 24 Mar 2017, In : Applied Physics Letters. 110, 12, 5 p., 124103.

Research output: Contribution to journalArticle

Open Access
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42 Downloads (Pure)

Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation

Smith, M. D., Thomson, D., Zubialevich, V. Z., Li, H., Naresh-Kumar, G., Trager-Cowan, C. & Parbrook, P. J., 31 Jan 2017, In : Physica Status Solidi A. 214, 1, 6 p., 1600353.

Research output: Contribution to journalArticle

Open Access
File
2 Citations (Scopus)
13 Downloads (Pure)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction

Naresh-Kumar, G., Vilalta-Clemente, A., Jussila, H., Winkelmann, A., Nolze, G., Vespucci, S., Nagarajan, S., Wilkinson, A. J. & Trager-Cowan, C., 7 Sep 2017, In : Scientific Reports. 7, 10 p., 10916.

Research output: Contribution to journalArticle

Open Access
File
11 Citations (Scopus)
90 Downloads (Pure)

Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa1-xN with x up to 0.56

Bruckbauer, J., Li, Z., Naresh-Kumar, G., Warzecha, M., Edwards, P. R., Jiu, L., Gong, Y., Bai, J., Wang, T., Trager-Cowan, C. & Martin, R. W., 7 Sep 2017, In : Scientific Reports. 7, 10 p., 10804.

Research output: Contribution to journalArticle

Open Access
File
8 Citations (Scopus)
128 Downloads (Pure)
2016
Open Access
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11 Citations (Scopus)
107 Downloads (Pure)

Optical and structural properties of GaN epitaxial layers on LiAlO2 substrates and their correlation with basal-plane stacking faults

Lutsenko, E. V., Rzheutski, M. V., Pavlovskii, V. N., Yablonskii, G. P., Alanzi, M., Hamidalddin, A., Alyamani, A., Mauder, C., Kalisch, H., Reuters, B., Heuken, M., Vescan, A., Naresh-Kumar, G. & Trager-Cowan, C., 15 Jan 2016, In : Journal of Crystal Growth. 434, p. 62-66 5 p.

Research output: Contribution to journalArticle

5 Citations (Scopus)
Open Access
File
2015

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

Vespucci, S., Winkelmann, A., Naresh-Kumar, G., Mingard, K. P., Maneuski, D., Edwards, P. R., Day, A. P., O'Shea, V. & Trager-Cowan, C., 15 Nov 2015, In : Physical Review B (Condensed Matter). 92, 20, 9 p., 205301.

Research output: Contribution to journalArticle

Open Access
File
26 Citations (Scopus)
363 Downloads (Pure)

Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N

Kusch, G., Nouf-Allehiani, M., Mehnke, F., Kuhn, C., Edwards, P. R., Wernicke, T., Knauer, A., Kueller, V., Naresh-Kumar, G., Weyers, M., Kneissl, M., Trager-Cowan, C. & Martin, R. W., 17 Aug 2015, In : Applied Physics Letters. 107, 7, 4 p., 072103.

Research output: Contribution to journalArticle

Open Access
File
13 Citations (Scopus)
101 Downloads (Pure)
2014

Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables

Edwards, P. R., Wallace, M. J., Kusch, G., Naresh-Kumar, G., Bruckbauer, J., Trager-Cowan, C., O'Donnell, K. P. & Martin, R. W., Aug 2014, In : Microscopy and Microanalysis. 20, S3, p. 906-907 2 p.

Research output: Contribution to journalConference Contribution

Open Access
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50 Downloads (Pure)

Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN

Naresh-Kumar, G., Bruckbauer, J., Edwards, P. R., Kraeusel, S., Hourahine, B., Martin, R. W., Kappers, M. J., Moram, M. A., Lovelock, S., Oliver, R. A., Humphreys, C. J. & Trager-Cowan, C., Feb 2014, In : Microscopy and Microanalysis. 20, 1, p. 55-60 6 p.

Research output: Contribution to journalArticle

Open Access
File
19 Citations (Scopus)
155 Downloads (Pure)

Electron channeling contrast imaging of defects in III-nitride semiconductors

Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A. & 6 others, Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. & Mingard, K. P., Aug 2014, In : Microscopy and Microanalysis. 20, S3, p. 1024-1025 2 p.

Research output: Contribution to journalConference Contribution

Open Access
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70 Downloads (Pure)

Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors

Naresh-Kumar, G., Vilalta-Clemente, A., Pandey, S., Skuridina, D., Behmenburg, H., Gamarra, P., Patriarche, G., Vickridge, I., di Forte-Poisson, M. A., Vogt, P., Kneissl, M., Morales, M., Ruterana, P., Cavallini, A., Cavalcoli, D., Giesen, C., Heuken, M. & Trager-Cowan, C., Dec 2014, In : AIP Advances. 4, 12, 13 p., 127101.

Research output: Contribution to journalArticle

Open Access
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13 Citations (Scopus)
81 Downloads (Pure)
2013

Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

Naresh Kumar, G., Mauder, C., Wang, K. R., Kraeusel, S., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kalisch, H., Vescan, A., Giesen, C., Heuken, M., Trampert, A., Day, A. P. & Trager-Cowan, C., 8 Apr 2013, In : Applied Physics Letters. 102, 14, 4 p., 142103.

Research output: Contribution to journalArticle

Open Access
File
15 Citations (Scopus)
119 Downloads (Pure)

Stress distribution of GaN layer grown on micro-pillar patterned GaN templates

Nagarajan, S., Svensk, O., Ali, M., Naresh-Kumar, G., Trager-Cowan, C., Suihkonen, S., Sopanen, M. & Lipsanen, H., 2013, In : Applied Physics Letters. 103, 1, 4 p., 012102.

Research output: Contribution to journalArticle

Open Access
File
10 Citations (Scopus)
193 Downloads (Pure)
2012

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

Trager-Cowan, C., Gunasekar, N., Hourahine, B., Edwards, P., Bruckbauer, J., Martin, R., Mauder, C., Day, A., England, G., Winkelmann, A., Parbrook, P. & Wilkinson, A., 2012, In : Microscopy and Microanalysis. 18, S2, p. 684-685 2 p.

Research output: Contribution to journalConference Contribution

1 Citation (Scopus)

Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope

Naresh-Kumar, G., Hourahine, B., Vilalta-Clemente, A., Ruterana, P., Gamarra, P., Lacam, C., Tordjman, M., Forte-Poisson, M. A. D., Parbrook, P. J., Day, A. P., England, G. & Trager-Cowan, C., Mar 2012, In : Physica Status Solidi A. 209, 3, p. 424-426 3 p.

Research output: Contribution to journalArticle

18 Citations (Scopus)

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope

Gunasekar, N., Hourahine, B., Edwards, P., Day, A. P., Winkelmann, A., Wilkinson, A. J., Parbrook, P. J., England, G. & Trager-Cowan, C., 30 Mar 2012, In : Physical Review Letters. 108, 13, 5 p., 135503.

Research output: Contribution to journalArticle

42 Citations (Scopus)