Engineering & Materials Science
Electrons
100%
Cathodoluminescence
72%
Nitrides
70%
Imaging techniques
68%
Electron diffraction
48%
Semiconductor materials
47%
Thin films
46%
Electron microscopes
43%
Scanning
35%
Defects
34%
Light emission
28%
Heterojunctions
23%
Crystal defects
23%
Vapor phase epitaxy
21%
Sapphire
19%
Diffraction
19%
Metallorganic vapor phase epitaxy
19%
Structural properties
18%
Scanning electron microscopy
18%
Photoluminescence
17%
Stacking faults
17%
Two dimensional electron gas
16%
Luminescence
16%
Characterization (materials science)
16%
Photoluminescence spectroscopy
15%
Metals
14%
Hyperspectral imaging
12%
Tungsten carbide
11%
Electron beams
11%
Cobalt
11%
Chemical analysis
11%
High electron mobility transistors
11%
Epitaxial films
10%
Ohmic contacts
10%
Nanowires
10%
Doping (additives)
10%
Light emitting diodes
10%
Substrates
10%
Electron probe microanalysis
9%
X-Ray Emission Spectrometry
9%
Crystals
9%
Optical properties
8%
Contact resistance
8%
Topography
8%
Atomic force microscopy
7%
Transmission electron microscopy
7%
Screw dislocations
6%
Dislocations (crystals)
6%
Strain relaxation
6%
Spectroscopy
5%
Physics & Astronomy
nitrides
67%
electrons
64%
cathodoluminescence
59%
defects
50%
electron microscopes
49%
scanning
40%
crystal defects
38%
diffraction
30%
thin films
26%
luminescence
20%
vapor phase epitaxy
20%
scanning electron microscopy
18%
polarity
18%
light emission
16%
image contrast
15%
characterization
15%
electron diffraction
14%
crystals
13%
tungsten carbides
13%
photometers
12%
optical properties
12%
metals
11%
diffraction patterns
11%
sapphire
10%
misalignment
10%
cobalt
10%
spectroscopy
10%
wavelengths
10%
wurtzite
9%
templates
9%
quantum wells
9%
gallium oxides
9%
triangulation
8%
antiphase boundaries
8%
topography
8%
high electron mobility transistors
8%
bows
8%
electron probes
8%
electron beams
8%
microanalysis
7%
molecular beam epitaxy
7%
photoluminescence
7%
metrology
7%
point sources
6%
nanowires
6%
light emitting diodes
6%
coalescing
6%
x rays
6%
stress distribution
6%
interlayers
6%
Chemical Compounds
Electron Particle
48%
Electron Backscatter Diffraction
46%
Threading Dislocation
37%
Cathodoluminescence
31%
Nitride
28%
Semiconductor
25%
Strain
20%
Vapor Phase Epitaxy
17%
Metallorganic Chemical Vapour Deposition
17%
Scanning Electron Microscopy
10%
Electron Mobility
10%
Epitaxial Film
10%
Tungsten
9%
Stacking Fault
9%
Contact Resistance
9%
Crystal Defect
8%
Photoluminescence Spectroscopy
7%
Nanowire
7%
Polarity
7%
Photoluminescence
7%
Metal
6%
Wavelength Dispersive X-Ray Spectroscopy
6%
Shallow Trap
5%
Luminiscence Type
5%
Optical Property
5%
