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Dive into the research topics where Naresh Gunasekar is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Projects
- 1 Active
Research Output
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Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J., Smith, M. D. & 17 others, , 5 Aug 2020, In: IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile -
AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy
Walde, S., Hagedorn, S., Coulon, P-M., Mogilatenko, A., Netzel, C., Weinrich, J., Susilo, N., Ziffer, E., Matiwe, L., Hartmann, C., Kusch, G., Alasmari, A., Naresh-Kumar, G., Trager-Cowan, C., Wernicke, T., Straubinger, T., Bickermann, M., Martin, R. W., Shields, P. A., Kneissl, M. & 1 others, , 1 Feb 2020, In: Journal of Crystal Growth. 531, 6 p., 125343.Research output: Contribution to journal › Article › peer-review
Open AccessFile3 Citations (Scopus)1 Downloads (Pure)
Datasets
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Data for: "AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy"
Walde, S. (Creator), Hagedorn, S. (Creator), Coulon, P. (Creator), Mogilatenko, A. (Contributor), Netzel, C. (Contributor), Weinrich, J. (Contributor), Susilo, N. (Contributor), Ziffer, E. (Contributor), Matiwe, L. (Contributor), Hartmann, C. (Contributor), Kusch, G. (Creator), Alasmari, A. M. A. (Creator), Gunasekar, N. (Contributor), Trager-Cowan, C. (Creator), Wernicke, T. (Contributor), Straubinger, T. (Contributor), Bickermann, M. (Contributor), Martin, R. (Contributor), Shields, P. A. (Contributor), Kneissl, M. (Contributor) & Weyers, M. (Contributor), University of Strathclyde, 25 Nov 2019
DOI: 10.15129/8478c60c-c3c4-4237-a762-e1684cf08493
Dataset
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Data for: "Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope"
Gunasekar, N. (Creator), Alasmari, A. M. A. (Contributor), Kusch, G. (Contributor), Edwards, P. (Contributor), Martin, R. (Contributor), Trager-Cowan, C. (Contributor) & Mingard, K. (Contributor), University of Strathclyde, 8 Apr 2020
DOI: 10.15129/d40c3955-5ca9-4464-9d7f-a8a1db31051a
Dataset