If you made any changes in Pure these will be visible here soon.
Filter
Chapter (peer-reviewed)

Search results

  • 2019

    Microscopy of defects in semiconductors

    Massabuau, F. C. -P., Bruckbauer, J., Trager-Cowan, C. & Oliver, R. A., 30 Sep 2019, Characaterisation and Control of Defects in Semiconductors. Tuomisto, F. (ed.). [S.I.], (Materials, Circuits and Devices).

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)peer-review

    Open Access
    File
    45 Downloads (Pure)