I am a postdoctoral researcher in the Advanced Materials Diffraction Lab, part of the Department of Physics. I received my PhD from the University of Strathclyde in 2013, where I investigated the luminescence properties of III-nitride semiconductor nanostructures and light-emitting diodes (LEDs). I also hold a Diplom (equivalent to an MSc) in Physics from the Technical University of Munich.

My current research focuses on the structural characterisation of semiconductor materials—particularly III-nitrides—using electron diffraction techniques in the scanning electron microscope. This work aims to advance our understanding of nanoscale material properties and supports the development of next-generation optoelectronic devices.

My research focuses on the structural characterisation and electron microscopy of semiconductor materials, with a particular emphasis on the III-nitride material system. III-nitrides are key to a wide range of applications, including solid-state lighting, optoelectronic devices (such as LEDs and laser diodes), high-power and high-frequency electronics, solar cells, water purification, and communication technologies.

A central aspect of my work is the application and development of scanning electron microscope (SEM)-based diffraction techniques, specifically electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI), using next-generation detectors. I am also interested in integrating these methods with complementary SEM techniques—such as cathodoluminescence (CL) hyperspectral imaging, X-ray microanalysis, and electron beam-induced current (EBIC)—to correlate structural and optical properties at the nano- and microscale.