Fabien Massabuau


  • United Kingdom

Accepting PhD Students

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Chapter (peer-reviewed)

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  • 2019

    Microscopy of defects in semiconductors

    Massabuau, F. C. -P., Bruckbauer, J., Trager-Cowan, C. & Oliver, R. A., 30 Sept 2019, Characaterisation and Control of Defects in Semiconductors. Tuomisto, F. (ed.). [S.I.], (Materials, Circuits and Devices).

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)peer-review

    Open Access
    4 Citations (Scopus)
    57 Downloads (Pure)