Physics
Atomic Force Microscopy
5%
Atoms
9%
Boundaries
12%
Bragg Reflector
5%
Cathodoluminescence
11%
Correlation
5%
Decay
5%
Defects
52%
Diamonds
9%
Dislocation
13%
Electric Fields
5%
Electrons
6%
Emission
33%
Gaps
8%
Growth
34%
Hydrogen
10%
Impact
25%
Increasing
5%
Independent Variables
5%
Indium
18%
Light Emitting Diode
7%
Luminescence
6%
Multiple Quantum Well
21%
Nucleation
6%
Optical Properties
29%
Photoluminescence
26%
Plane
18%
Position (Location)
6%
Probe
5%
Quantum Wells
100%
Recombination
23%
Region
18%
Retarding
6%
Room Temperature
10%
Single Crystals
7%
Spectra
8%
Stacking
7%
Strain
6%
Substrates
15%
Technology
6%
Temperature
24%
Thin Films
5%
Transmission Electron Microscopy
7%
Valence
6%
Variations
10%
Wafer
7%
Width
12%
Material Science
Alloy
8%
Aluminum Nitride
15%
Amorphous Material
5%
Annealing
6%
Atomic Force Microscopy
6%
Cathodoluminescence
6%
Characterization
8%
Chemical Vapor Deposition
8%
Crystalline Material
9%
Defect
29%
Density
16%
Detector
9%
Devices
14%
Diamond
24%
Electrical Property
5%
Electronic Property
5%
Epilayers
12%
Film
9%
Gallium
12%
Graphene
5%
Indium
5%
Light-Emitting Diode
13%
Luminescence
9%
Material
15%
Membrane
9%
Metal
5%
Microstructure
6%
Nitride Compound
15%
Optical Property
40%
Optoelectronics
5%
Oxide Compound
12%
Photoluminescence
29%
Photosensor
8%
Quantum Well
44%
Sapphire
18%
Scanning Electron Microscopy
5%
Semiconductor Material
11%
Single Crystal
7%
Stacking Fault
7%
Strain
8%
Temperature
44%
Thin Films
12%
Thin Films
6%
Tomography
5%
Transmission Electron Microscopy
6%
Ultimate Tensile Strength
5%
X-Ray Diffraction
5%
Chemistry
Ambient Reaction Temperature
6%
Atomic Force Microscopy
6%
Blue
8%
Conduction Band
6%
Density
6%
Dislocation
14%
Electron Particle
11%
Energy
13%
Engineering Process
6%
Green
11%
Hydrogen
6%
Indium
13%
Liquid Film
15%
Luminiscence Type
5%
Nitride
7%
Optical Property
27%
Photoluminescence
18%
Photoluminescence Spectrum
5%
Purity
6%
Radiative Recombination
8%
Reaction Temperature
19%
Recombination
8%
Sample
18%
Segregation
5%
Stacking Fault
6%
Surface
12%
Surface Structure
5%
Time
8%
Transmission Electron Microscopy
5%
UV/VIS Spectroscopy
9%
Valence Band
8%
X-Ray Diffraction
5%
