Massabuau, F. C.-P., Bruckbauer, J., Trager-Cowan, C. & Oliver, R. A., 30 Sept 2019, Characaterisation and Control of Defects in Semiconductors. Tuomisto, F. (ed.). [S.I.], (Materials, Circuits and Devices).
Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review