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Research Output 1997 2019

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Conference Contribution
2017

Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

Pascal, E., Singh, S., Hourahine, B., Trager-Cowan, C. & De Graef, M., 4 Aug 2017, In : Microscopy and Microanalysis. 23, S1, p. 540-541 2 p.

Research output: Contribution to journalConference Contribution

Open Access
File
Electron diffraction
Diffraction patterns
diffraction patterns
Electrons
Mountings
2014

Electron channeling contrast imaging of defects in III-nitride semiconductors

Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A. & 6 othersHumphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. & Mingard, K. P., Aug 2014, In : Microscopy and Microanalysis. 20, S3, p. 1024-1025 2 p.

Research output: Contribution to journalConference Contribution

Open Access
File
2012
1 Citation (Scopus)

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

Trager-Cowan, C., Gunasekar, N., Hourahine, B., Edwards, P., Bruckbauer, J., Martin, R., Mauder, C., Day, A., England, G., Winkelmann, A., Parbrook, P. & Wilkinson, A., 2012, In : Microscopy and Microanalysis. 18, S2, p. 684-685 2 p.

Research output: Contribution to journalConference Contribution

Semiconductors
Dislocations (crystals)
Nitrides
nitrides
Electrons