20142020

Research output per year

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Research Output

  • 6 Article
  • 1 Conference Contribution
2020

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 12 Feb 2020, In : Semiconductor Science and Technology.

Research output: Contribution to journalArticle

Open Access
File
2019

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In : Photonics Research. 7, 11, p. B73-B82 10 p.

Research output: Contribution to journalArticle

Open Access
File
1 Citation (Scopus)
2017

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In : Acta Materialia. 125, p. 125-135 11 p.

Research output: Contribution to journalArticle

Open Access
File
3 Citations (Scopus)
172 Downloads (Pure)

Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes

Le Boulbar, E. D., Priesol, J., Nouf-Allehiani, M., Naresh-Kumar, G., Fox, S., Trager-Cowan, C., Šatka, A., Allsopp, D. W. E. & Shields, P. A., 15 May 2017, In : Journal of Crystal Growth. p. 30-38 9 p.

Research output: Contribution to journalArticle

Open Access
File
5 Citations (Scopus)
108 Downloads (Pure)
2016
Open Access
File
10 Citations (Scopus)
103 Downloads (Pure)
2015

Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N

Kusch, G., Nouf-Allehiani, M., Mehnke, F., Kuhn, C., Edwards, P. R., Wernicke, T., Knauer, A., Kueller, V., Naresh-Kumar, G., Weyers, M., Kneissl, M., Trager-Cowan, C. & Martin, R. W., 17 Aug 2015, In : Applied Physics Letters. 107, 7, 4 p., 072103.

Research output: Contribution to journalArticle

Open Access
File
10 Citations (Scopus)
100 Downloads (Pure)
2014

Electron channeling contrast imaging of defects in III-nitride semiconductors

Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A. & 6 others, Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. & Mingard, K. P., Aug 2014, In : Microscopy and Microanalysis. 20, S3, p. 1024-1025 2 p.

Research output: Contribution to journalConference Contribution

Open Access
File
70 Downloads (Pure)