No photo of Allehiani Mohammad S

Allehiani Mohammad S

Mrs

 https://orcid.org/0000-0002-4338-1048
20142019
If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Allehiani Mohammad S is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 18 Similar Profiles
Nitrides Engineering & Materials Science
Thin films Engineering & Materials Science
nitrides Physics & Astronomy
Imaging techniques Engineering & Materials Science
Electrons Engineering & Materials Science
Electron diffraction Engineering & Materials Science
Dislocations (crystals) Engineering & Materials Science
cathodoluminescence Physics & Astronomy

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 2014 2019

  • 5 Article
  • 1 Conference Contribution

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 16 othersKneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In : Photonics Research. 7, 11, p. B73-B82 10 p.

Research output: Contribution to journal › Article

Open Access
File
Nitrides
nitrides
Semiconductor materials
Thin films
Scanning electron microscopy
3 Citations (Scopus)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In : Acta Materialia. 125, p. 125-135 11 p.

Research output: Contribution to journal › Article

Open Access
File
Electron diffraction
Imaging techniques
Thin films
Electrons
Screw dislocations

Datasets

Data for: "The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films"

Trager-Cowan, C. (Creator), Alasmari, A. M. A. (Creator), Bruckbauer, J. (Creator), Kusch, G. (Creator), Gunasekar, N. (Creator), Mohammad S, A. (Creator), Spasevski, L. (Creator), Coulon, P. (Creator), Winkelmann, A. (Creator), University of Strathclyde, 28 Oct 2019

DOI: 10.15129/b5238863-a088-4f30-8b13-2625260eb73a

Dataset

Data resulting from an investigation of wide-bandgap silicon-doped AlGaN

Kusch, G. (Creator), Edwards, P. (Creator), Martin, R. (Creator), University of Strathclyde, 2015

DOI: 10.15129/9465dccd-6d17-4a84-9d61-8d6fed1c7201

Dataset