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Allehiani Mohammad S

Mrs

 https://orcid.org/0000-0002-4338-1048
20142019
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Fingerprint Dive into the research topics where Allehiani Mohammad S is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 17 Similar Profiles
Nitrides Engineering & Materials Science
Thin films Engineering & Materials Science
nitrides Physics & Astronomy
Imaging techniques Engineering & Materials Science
Electrons Engineering & Materials Science
Electron diffraction Engineering & Materials Science
Dislocations (crystals) Engineering & Materials Science
Electron microscopes Engineering & Materials Science

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Research Output 2014 2019

  • 5 Article
  • 1 Conference Contribution

The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 14 othersKneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y. P., Smith, R. M., Wang, T. & Winkelmann, A., 13 Sep 2019, (Accepted/In press) In : Photonics Research.

Research output: Contribution to journal › Article

Nitrides
nitrides
Electron microscopes
electron microscopes
Semiconductor materials
3 Citations (Scopus)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In : Acta Materialia. 125, p. 125-135 11 p.

Research output: Contribution to journal › Article

Open Access
File
Electron diffraction
Imaging techniques
Thin films
Electrons
Screw dislocations

Datasets

Electron channelling contrast and cathodoluminescence images obtained from III-nitride layer structures

Gunasekar, N. (Creator), University of Strathclyde, 2016

DOI: 10.15129/b9e0ba43-2a2e-4ffa-a842-1d743a1d3175

Dataset

Data for: "Design and fabrication of enhanced lateral growth for dislocation reduction and strain management in GaN using nanodashes"

Shields, P. (Creator), Le Boulbar, E. D. (Creator), Priesol, J. (Creator), Šatka, A. (Creator), Mohammad S, A. (Creator), Gunasekar, N. (Creator), Fox, S. (Creator), Trager-Cowan, C. (Creator), 11 Oct 2017

DOI: 10.15125/BATH-00257

Dataset