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Fingerprint Dive into the research topics where Allehiani Mohammad S is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 16 Similar Profiles
Imaging techniques Engineering & Materials Science
Nitrides Engineering & Materials Science
Thin films Engineering & Materials Science
nitrides Physics & Astronomy
cathodoluminescence Physics & Astronomy
Electron diffraction Engineering & Materials Science
Electrons Engineering & Materials Science
Semiconductor materials Engineering & Materials Science

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Research Output 2014 2019

  • 5 Article
  • 1 Conference Contribution
1 Citation (Scopus)

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In : Photonics Research. 7, 11, p. B73-B82 10 p.

Research output: Contribution to journalArticle

Open Access
Semiconductor materials
Thin films
Scanning electron microscopy
3 Citations (Scopus)
172 Downloads (Pure)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In : Acta Materialia. 125, p. 125-135 11 p.

Research output: Contribution to journalArticle

Open Access
Electron diffraction
Imaging techniques
Thin films
Screw dislocations