Research output per year
Research output per year
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Dive into the research topics where Allehiani Mohammad S is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Research output
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Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Jablon, B. M., Johnston, R., Martin, R. W., McDermott, R., Naresh-Kumar, G., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Mingard, K., Parbrook, P. J., Smith, M. D. & 17 others, , 5 Aug 2020, In: IOP Conference Series: Materials Science and Engineering. 891, 1, 11 p., 012023.Research output: Contribution to journal › Conference article › peer-review
Open AccessFile -
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J. & 17 others, , 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.Research output: Contribution to journal › Article › peer-review
Open AccessFile2 Citations (Scopus)7 Downloads (Pure)
Datasets
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Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”
Trager-Cowan, C. (Creator), Alasmari, A. M. A. (Creator), Avis, W. (Contributor), Bruckbauer, J. (Creator), Edwards, P. (Contributor), Hourahine, B. (Contributor), Kraeusel, S. (Contributor), Kusch, G. (Creator), Johnston, R. (Contributor), Gunasekar, N. (Creator), Martin, R. (Contributor), Mohammad S, A. (Creator), Pascal, E. (Contributor), Spasevski, L. (Creator), Thomson, D. (Contributor), Vespucci, S. (Contributor), Parbrook, P. (Contributor), Smith, M. (Contributor), Enslin, J. (Contributor), Mehnke, F. (Contributor), Kneissl, M. (Contributor), Kuhn, C. (Contributor), Wernicke, T. (Contributor), Hagedorn, S. (Contributor), Knauer, A. (Contributor), Kueller, V. (Contributor), Walde, S. (Contributor), Weyers, M. (Contributor), Coulon, P. (Creator), Shields, P. (Contributor), Zhang, Y. (Contributor), Jiu, L. (Contributor), Gong, Y. (Contributor), Smith, R. M. (Contributor), Wang, T. (Contributor) & Winkelmann, A. (Creator), University of Strathclyde, 28 Oct 2019
DOI: 10.15129/b5238863-a088-4f30-8b13-2625260eb73a
Dataset
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Data resulting from an investigation of wide-bandgap silicon-doped AlGaN
Kusch, G. (Creator), Mohammad S, A. (Contributor), Edwards, P. (Creator), Gunasekar, N. (Contributor), Trager-Cowan, C. (Contributor) & Martin, R. (Creator), University of Strathclyde, 2015
DOI: 10.15129/9465dccd-6d17-4a84-9d61-8d6fed1c7201
Dataset