20142019
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Fingerprint Dive into the research topics where Allehiani Mohammad S is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 17 Similar Profiles
Nitrides Engineering & Materials Science
Thin films Engineering & Materials Science
nitrides Physics & Astronomy
Imaging techniques Engineering & Materials Science
Electrons Engineering & Materials Science
Electron diffraction Engineering & Materials Science
Dislocations (crystals) Engineering & Materials Science
Electron microscopes Engineering & Materials Science

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Research Output 2014 2019

  • 5 Article
  • 1 Conference Contribution

The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 14 othersKneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y. P., Smith, R. M., Wang, T. & Winkelmann, A., 13 Sep 2019, (Accepted/In press) In : Photonics Research.

Research output: Contribution to journalArticle

Nitrides
nitrides
Electron microscopes
electron microscopes
Semiconductor materials
3 Citations (Scopus)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M. A., Trager-Cowan, C. & Wilkinson, A. J., 15 Feb 2017, In : Acta Materialia. 125, p. 125-135 11 p.

Research output: Contribution to journalArticle

Open Access
File
Electron diffraction
Imaging techniques
Thin films
Electrons
Screw dislocations