Elvin, R.,
Hoth, G. W.,
Wright, M.,
Lewis, B.,
Bregazzi, A.,
Keliehor, B.,
Arnold, A. S.,
Griffin, P. F. &
Riis, E.,
25 Feb 2020,
Proceedings Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II. Shahriar, S. M. & Scheuer, J. (eds.). Bellingham, WA,
Vol. 11296.
p. 1129609 6 p. (Proceedings of SPIE; vol. 11296).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book