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- 1 Similar Profiles
Collaborations and top research areas from the last five years
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Imaging misorientation and strain of single dislocations in GaN using electron backscatter diffraction
Hiller, K. P., Cios, G., Winkelmann, A., Wheeler, J., Parbrook, P. J., Hourahine, B., Trager-Cowan, C. & Bruckbauer, J., 1 Apr 2026, (E-pub ahead of print) In: Acta Materialia. 27 p., 122185.Research output: Contribution to journal › Article › peer-review
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Strain-induced modifications of thin film silicon membranes by physical bending
Margariti, E., Bruckbauer, J., Winkelmann, A., Guilhabert, B., Gunasekar, N.-K., Trager-Cowan, C., Martin, R. & Strain, M., 17 May 2025, In: Materials. 18, 10, 15 p., 2335.Research output: Contribution to journal › Article › peer-review
Open AccessFile24 Downloads (Pure)
Datasets
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Data for: "Improving EBSD precision by orientation refinement with full pattern matching"
Winkelmann, A. (Creator), Jablon, B. M. (Creator), Tong, V. (Creator), Trager-Cowan, C. (Creator) & Mingard, K. (Creator), University of Strathclyde, 13 Feb 2020
DOI: 10.15129/0757bccc-5df8-43ac-92a6-2e758d8952a5
Dataset
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Data for: "Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging"
Jablon, B. M. (Creator), Mingard, K. (Creator), Winkelmann, A. (Creator), Gunasekar, N. (Creator), Hourahine, B. (Creator) & Trager-Cowan, C. (Creator), University of Strathclyde, 18 Dec 2019
DOI: 10.15129/c80a3a0c-a718-4941-ac82-8981d21799ce
Dataset
Activities
- 2 Invited talk
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Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures
Trager-Cowan, C. (Invited speaker), Bruckbauer, J. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Alasmari, A. M. A. (Contributor), Gunasekar, N. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
10 Jun 2024Activity: Talk or Presentation › Invited talk
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Invited Talk: Materials Research Society Fall Meeting, US, December 2023. Title: Pushing the Limits of Diffraction Imaging in the Scanning Electron Microscope for the Structural Characterisation of Semiconductor Thin Films and Microstructures
Trager-Cowan, C. (Speaker), Bruckbauer, J. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
1 Dec 2023Activity: Talk or Presentation › Invited talk