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Aimo Winkelmann

Dr

  • United Kingdom

20192019
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  • 20 Similar Profiles
Electron diffraction Engineering & Materials Science
Light emission Engineering & Materials Science
tungsten carbides Physics & Astronomy
light emission Physics & Astronomy
Tungsten carbide Engineering & Materials Science
Cathodoluminescence Engineering & Materials Science
Cobalt Chemical Compounds
Electrons Engineering & Materials Science

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Research Output 2019 2019

Open Access
File
Light emission
Nanowires
light emission
polarity
nanowires

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 16 othersKneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In : Photonics Research. 7, 11, p. B73-B82 10 p.

Research output: Contribution to journalArticle

Open Access
File
Nitrides
nitrides
Semiconductor materials
Thin films
Scanning electron microscopy