Research output per year
Research output per year
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Dive into the research topics where Aimo Winkelmann is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction
Hiller, K. P., Winkelmann, A., Hourahine, B., Starosta, B., Alasmari, A., Feng, P., Wang, T., Parbrook, P. J., Zubialevich, V. Z., Hagedorn, S., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Bruckbauer, J. & Trager-Cowan, C., 31 Dec 2023, In: Microscopy and Microanalysis. 29, 6, p. 1879-1888 10 p.Research output: Contribution to journal › Article › peer-review
Open AccessFile54 Downloads (Pure) -
Kikuchi pattern simulations of backscattered and transmitted electrons
Winkelmann, A., Nolze, G., Cios, G., Tokarski, T., Bała, P., Hourahine, B. & Trager‐Cowan, C., 30 Nov 2021, In: Journal of Microscopy. 284, 2, p. 157-184 28 p.Research output: Contribution to journal › Article › peer-review
Open AccessFile13 Citations (Scopus)81 Downloads (Pure)
Datasets
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Data for: "Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging"
Jablon, B. M. (Creator), Mingard, K. (Creator), Winkelmann, A. (Creator), Gunasekar, N. (Creator), Hourahine, B. (Creator) & Trager-Cowan, C. (Creator), University of Strathclyde, 18 Dec 2019
DOI: 10.15129/c80a3a0c-a718-4941-ac82-8981d21799ce
Dataset
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Data for: "Improving EBSD precision by orientation refinement with full pattern matching"
Winkelmann, A. (Creator), Jablon, B. M. (Creator), Tong, V. (Creator), Trager-Cowan, C. (Creator) & Mingard, K. (Creator), University of Strathclyde, 13 Feb 2020
DOI: 10.15129/0757bccc-5df8-43ac-92a6-2e758d8952a5
Dataset
Activities
- 2 Invited talk
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Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures
Trager-Cowan, C. (Invited speaker), Bruckbauer, J. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Alasmari, A. M. A. (Contributor), Gunasekar, N. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
10 Jun 2024Activity: Talk or presentation types › Invited talk
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Invited Talk: Materials Research Society Fall Meeting, US, December 2023. Title: Pushing the Limits of Diffraction Imaging in the Scanning Electron Microscope for the Structural Characterisation of Semiconductor Thin Films and Microstructures
Trager-Cowan, C. (Speaker), Bruckbauer, J. (Contributor), McDermott, R. (Contributor), Waters, D. (Contributor), Hiller, K. (Contributor), Hourahine, B. (Contributor), Cios, G. (Contributor) & Winkelmann, A. (Contributor)
1 Dec 2023Activity: Talk or presentation types › Invited talk