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Aimo Winkelmann


  • United Kingdom

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  • 27 Similar Profiles
Light emission Chemical Compounds
Electron microscopes Chemical Compounds
electron microscopes Physics & Astronomy
Scanning Chemical Compounds
Electron diffraction Chemical Compounds
scanning Physics & Astronomy
light emission Physics & Astronomy
Cathodoluminescence Chemical Compounds

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Research Output 2019 2019

Open Access
Light emission
light emission

The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 14 othersKneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y. P., Smith, R. M., Wang, T. & Winkelmann, A., 13 Sep 2019, (Accepted/In press) In : Photonics Research.

Research output: Contribution to journalArticle

Electron microscopes
electron microscopes
Semiconductor materials