X-ray diffractometer (XRD)

    Gerard Johnston (Manager)
Mechanical And Aerospace Engineering

Facility/equipment: Equipment

  • James Weir Building

Description

Suitable for metals and ceramics, at ambient and high temperatures (up to 2000°C). Specimens can be in bulk or powder form, thin films, corrosion products or debris.

Measured Properties:

Phase composition Crystal structure Lattice parameters & mismatches Spatial orientation of crystals Crystallinity Residual stress Grain texture Layer thickness

Details

NameX-ray diffractometer (XRD)
Acquisition date1/08/10
ManufacturersBruker

Fingerprint

ceramics
corrosion
films (materials)
powders
X-radiation
metals
temperature

Contact information

Emailsg.johnston@strath.ac.uk
LinksWebsite

Terms of loan/booking

Available for loan - internal and external