Equipments Details
Description
Suitable for metals and ceramics, at ambient and high temperatures (up to 2000°C). Specimens can be in bulk or powder form, thin films, corrosion products or debris.
Measured Properties:
Phase composition Crystal structure Lattice parameters & mismatches Spatial orientation of crystals Crystallinity Residual stress Grain texture Layer thicknessDetails
| Name | X-ray diffractometer (XRD) |
|---|---|
| Acquisition date | 1/08/10 |
| Manufacturers | Bruker |
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