X-ray diffractometer (XRD)

Facility/equipment: Equipment

  • James Weir Building

Equipments Details


Suitable for metals and ceramics, at ambient and high temperatures (up to 2000°C). Specimens can be in bulk or powder form, thin films, corrosion products or debris.

Measured Properties:

Phase composition Crystal structure Lattice parameters & mismatches Spatial orientation of crystals Crystallinity Residual stress Grain texture Layer thickness


NameX-ray diffractometer (XRD)
Acquisition date1/08/10


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