SEM SIRION 200

2022

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy

Naresh-Kumar, G., Edwards, P. R., Batten, T., Nouf-Allehiani, M., Vilalta-Clemente, A., Wilkinson, A. J., Le Boulbar, E., Shields, P. A., Starosta, B., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 21 Feb 2022, In: Journal of Applied Physics. 131, 7, 9 p., 075303.

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3 Citations (Scopus)

41 Downloads (Pure)

2020

The 2020 UV emitter roadmap

Amano, H., Collazo, R., De Santi, C., Einfeldt, S., Funato, M., Glaab, J., Hagedorn, S., Hirano, A., Hirayama, H., Ishii, R., Kashima, Y., Kawakami, Y., Kirste, R., Kneissl, M., Martin, R., Mehnke, F., Meneghini, M., Ougazzaden, A., Parbrook, P. J. & Rajan, S. & 16 others, Reddy, P., Römer, F., Ruschel, J., Sarkar, B., Scholz, F., Schowalter, L. J., Shields, P., Sitar, Z., Sulmoni, L., Wang, T., Wernicke, T., Weyers, M., Witzigmann, B., Wu, Y.-R., Wunderer, T. & Zhang, Y., 15 Sept 2020, In: Journal of Physics D: Applied Physics. 53, 50, 57 p., 503001.

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403 Citations (Scopus)

67 Downloads (Pure)

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J. & Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P.-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.

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8 Citations (Scopus)

41 Downloads (Pure)

2019

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J. & Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.

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9 Citations (Scopus)

35 Downloads (Pure)

2018

Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

Naresh-Kumar, G., Thomson, D., Zhang, Y., Bai, J., Jiu, L., Yu, X., Gong, Y. P., Martin, R. S., Wang, T. & Trager-Cowan, C., 10 Aug 2018, (E-pub ahead of print) In: Journal of Applied Physics. 124, 6, 6 p., 065301.

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6 Citations (Scopus)

39 Downloads (Pure)

Generated carrier dynamics in V-pit enhanced InGaN/GaN light emitting diode

Ajia, I. A., Edwards, P. R., Pak, Y., Belekov, E., Roldan, M. A., Wei, N., Liu, Z., Martin, R. W. & Roqan, I. S., 21 Mar 2018, In: ACS Photonics. 5, 3, p. 820-826 7 p.

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68 Citations (Scopus)

100 Downloads (Pure)

2017

Spatially-resolved optical and structural properties of semi-polar (11-22) Al_xGa_1-xN with x up to 0.56

Bruckbauer, J., Li, Z., Naresh-Kumar, G., Warzecha, M., Edwards, P. R., Jiu, L., Gong, Y., Bai, J., Wang, T., Trager-Cowan, C. & Martin, R. W., 7 Sept 2017, In: Scientific Reports. 7, 10 p., 10804.

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11 Citations (Scopus)

169 Downloads (Pure)

Characteristics of GaN-based light emitting diodes with different thicknesses of buffer layer grown by HVPE and MOCVD

Tian, P., Edwards, P. R., Wallace, M. J., Martin, R. W., McKendry, J. J. D., Gu, E., Dawson, M. D., Qiu, Z.-J., Jia, C., Chen, Z., Zhang, G., Zheng, L. & Liu, R., 23 Jan 2017, In: Journal of Physics D: Applied Physics. 50, 7, 12 p., 075101.

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30 Citations (Scopus)

147 Downloads (Pure)

2016

Electron channelling contrast imaging for III-nitride thin film structures

Naresh-Kumar, G., Thomson, D., Nouf-Allehiani, M., Bruckbauer, J., Edwards, P. R., Hourahine, B., Martin, R. W. & Trager-Cowan, C., 1 Jun 2016, In: Materials Science in Semiconductor Processing. 47, p. 44-50 7 p.

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20 Citations (Scopus)

136 Downloads (Pure)

2015

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

Vespucci, S., Winkelmann, A., Naresh-Kumar, G., Mingard, K. P., Maneuski, D., Edwards, P. R., Day, A. P., O'Shea, V. & Trager-Cowan, C., 15 Nov 2015, In: Physical Review B (Condensed Matter). 92, 20, 9 p., 205301.

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45 Citations (Scopus)

394 Downloads (Pure)

Spatial clustering of defect luminescence centers in Si-doped low resistivity Al_0.82Ga_0.18N

Kusch, G., Nouf-Allehiani, M., Mehnke, F., Kuhn, C., Edwards, P. R., Wernicke, T., Knauer, A., Kueller, V., Naresh-Kumar, G., Weyers, M., Kneissl, M., Trager-Cowan, C. & Martin, R. W., 17 Aug 2015, In: Applied Physics Letters. 107, 7, 4 p., 072103.

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23 Citations (Scopus)

143 Downloads (Pure)

SEM SIRION 200

Research output

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